Observation of long transients in the electrical characterization of thin film BST capacitors

被引:3
作者
Pervez, NK [1 ]
Hansen, PJ
Taylor, TR
Speck, JS
York, RA
机构
[1] Univ Calif Santa Barbara, Dept Elect & Comp Engn, Santa Barbara, CA 93106 USA
[2] Univ Calif Santa Barbara, Dept Mat, Santa Barbara, CA 93106 USA
关键词
transient leakage current; barium strontium titanate; BST; hysteresis;
D O I
10.1080/10584580390258651
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Charge trapping is responsible for long transient leakage currents observed in parallel plate thin film BST capacitors. The presence of such time dependence complicates the measurement of leakage current as a function of an applied voltage, with the voltage sweep introducing hysteresis in the absence of ferroelectricity. The effect of long transients on current-voltage sweeps is discussed, as well as a method of obtaining current-voltage characteristics in the presence of transient leakage currents.
引用
收藏
页码:503 / 511
页数:9
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