X-ray phase imaging with a grating interferometer

被引:1101
作者
Weitkamp, T [1 ]
Diaz, A
David, C
Pfeiffer, F
Stampanoni, M
Cloetens, P
Ziegler, E
机构
[1] Paul Scherrer Inst, Lab Micro & Nanotechnol, CH-5232 Villigen, Switzerland
[2] Paul Scherrer Inst, Swiss Light Source, CH-5232 Villigen, Switzerland
[3] European Synchrotron Radiat Facil, F-38043 Grenoble, France
来源
OPTICS EXPRESS | 2005年 / 13卷 / 16期
关键词
D O I
10.1364/OPEX.13.006296
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Using a high-efficiency grating interferometer for hard X rays ( 10 - 30 keV) and a phase-stepping technique, separate radiographs of the phase and absorption profiles of bulk samples can be obtained from a single set of measurements. Tomographic reconstruction yields quantitative three-dimensional maps of the X-ray refractive index, with a spatial resolution down to a few microns. The method is mechanically robust, requires little spatial coherence and monochromaticity, and can be scaled up to large fields of view, with a detector of correspondingly moderate spatial resolution. These are important prerequisites for use with laboratory X-ray sources. (C) 2005 Optical Society of America.
引用
收藏
页码:6296 / 6304
页数:9
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