VLSI-NEMS chip for AFM data storage

被引:31
作者
Despont, M [1 ]
Brugger, J [1 ]
Drechsler, U [1 ]
Dürig, U [1 ]
Häberle, W [1 ]
Lutwyche, M [1 ]
Rothuizen, H [1 ]
Stutz, R [1 ]
Widmer, R [1 ]
Rohrer, H [1 ]
Binnig, G [1 ]
Vettiger, P [1 ]
机构
[1] IBM Corp, Div Res, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland
来源
MEMS '99: TWELFTH IEEE INTERNATIONAL CONFERENCE ON MICRO ELECTRO MECHANICAL SYSTEMS, TECHNICAL DIGEST | 1999年
关键词
D O I
10.1109/MEMSYS.1999.746890
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
We report the microfabrication of a 32x32 (1024) 2D cantilever array chip and its electrical testing. It has been designed for ultrahigh-density, high-speed data storage applications using thermomechanical writing and thermal readout in thin polymer film storage media. The fabricated chip is the first VLSI-NEMS (NanoEMS) for nanotechnological applications. For electrical and thermal stability, the levers are made of silicon and the heater/sensor element is defined as a lower doped platform with the tip on top. Freestanding cantilevers are obtained with surface micromachining techniques, which result in better mechanical stability and heatsinking of the chip than with bulk micromachining releasing techniques. Two wiring levels interconnect the cantilevers for a time-multiplexed row/column addressing scheme. Two different versions for the array interconnections have been implemented, one with an additional Schottky diode in series with the lever to reduce crosstalk between levers, and one without diodes to investigate various addressing schemes.
引用
收藏
页码:564 / 569
页数:6
相关论文
共 12 条
  • [1] CHUI BW, 1997, P IEEE TRANSD 97 CHI
  • [2] Future trends in hard disk drives
    Grochowski, Edward
    Hoyt, Roger F.
    [J]. IEEE Transactions on Magnetics, 1996, 32 (3 /2) : 1850 - 1854
  • [3] LUTWYCHE MI, 1998, P IEEE INT WORKSH ME
  • [4] MACDONALD NC, 1993, 7 INT C SOL STAT SEN, P8
  • [5] High-density data storage using proximal probe techniques
    Mamin, HJ
    Terris, BD
    Fan, LS
    Hoen, S
    Barrett, RC
    Rugar, D
    [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1995, 39 (06) : 681 - 699
  • [6] Automated parallel high-speed atomic force microscopy
    Minne, SC
    Yaralioglu, G
    Manalis, SR
    Adams, JD
    Zesch, J
    Atalar, A
    Quate, CF
    [J]. APPLIED PHYSICS LETTERS, 1998, 72 (18) : 2340 - 2342
  • [7] OXIDATION SHARPENING OF SILICON TIPS
    RAVI, TS
    MARCUS, RB
    LIU, D
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (06): : 2733 - 2737
  • [8] 6-MHz 2-N/m piezoresistive atomic-force-microscope cantilevers with INCISIVE tips
    Ried, RP
    Mamin, J
    Terris, BD
    Fan, LS
    Rugar, D
    [J]. JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 1997, 6 (04) : 294 - 302
  • [9] SZE SM, 1981, PHYSICS SEMICONDUCTO
  • [10] VETTIGER P, 1998, IN PRESS MICROELECTR