Fast optical metrology of the hard x-ray optics for the High Energy Focusing Telescope (HEFT)

被引：6

作者：

Jimenez-Garate, MA ^{[1
]}

Craig, WW ^{[1
]}

Hailey, CJ ^{[1
]}

机构：

[1] Columbia Univ, Columbia Astrophys Lab, New York, NY 10027 USA

来源：

X-RAY OPTICS, INSTRUMENTS, AND MISSIONS | 1998年 / 3444卷

关键词：

x-ray optics; surface metrology; x-ray telescopes; surface figure; optical testing; Wolter I optics; thin foil optics;

D O I：

10.1117/12.331284

中图分类号：

P1 [天文学];

学科分类号：

0704 ;

摘要：

We describe a fast figure metrology system designed for the several thousand mirror quadrants in the High Energy Focusing Telescope (HEFT) balloon experiment. HEFT's multilayer coated hard x-ray optics will have similar to 1 arcminute HEW and operate at 20-80 keV. The optics are a conical approximation to the Wolter-I configuration. Our automated system can measure the axial figure error, in-phase and out-of-phase roundness errors of a mirror quadrant, and output their HEW contribution to the x-ray telescope. An optical laser scans a conical mirror in two cylindrical coordinate axes. A 2-D position sensitive diode (PSD) measures the reflected beam to similar to 4 arcseconds. The conical mirror can have greater than or equal to 3 cm radius. We show the figure measurements of HEFT's aluminum foil and thermally formed glass substrates.

引用

页码：622 / 633

页数：12

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