Cantilever dynamics and quality factor control in AC mode AFM height measurements

被引：38

作者：

Chen, Liwei ^{[1
]}

Yu, Xuechun ^{[1
]}

Wang, Dan ^{[1
]}

机构：

[1] Ohio Univ, Dept Chem & Biochem, Athens, OH 45701 USA

来源：

ULTRAMICROSCOPY | 2007年 / 107卷 / 4-5期

关键词：

atoinic force microscopy (AFM); ATOMIC-FORCE MICROSCOPY; RESOLUTION; SPEED;

D O I：

10.1016/j.ultramic.2006.06.006

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We show that inconsistent-imaging dynamics, in which the cantilever oscillates in the attractive regime on substrate background but in the repulsive regime oil sample, leads to artifacts in apparent height ill AC mode Atomic force microscopy. Active Q control can be used to effectively tune the imaging dynamics. Increased effective Q promotes the attractive regime, improves imaging sensitivity, and results in less invasive imaging of soft biological molecules. (c) 2006 Elsevier B.V. All rights reserved.

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页码：275 / 280

页数：6

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