Characterization of capacitance-frequency features of Sn/polypyrrole/n-Si structure as a function of temperature

被引：38

作者：

Aydogan, S ^{[1
]}

Saglam, M ^{[1
]}

Türüt, A ^{[1
]}

机构：

[1] Ataturk Univ, Fac Sci & Arts, Dept Phys, TR-25240 Erzurum, Turkey

来源：

POLYMER | 2005年 / 46卷 / 16期

关键词：

polypyrrole; interface state of density; relaxation time;

D O I：

10.1016/j.polymer.2005.04.102

中图分类号：

O63 [高分子化学（高聚物）];

学科分类号：

070305 ; 080501 ; 081704 ;

摘要：

Temperature-dependent, the capacitance-frequency measurements of Sn/polypyrrole/n-Si structure have been carried out by using the Schottky capacitance spectroscopy (SCS) technique. It has seen that capacitance almost independent of temperature up to a certain value of frequency but the capacitance decrease at high frequencies. Besides, the interface states densities show a decrease with bias from the bottom of the conduction band towards the midgap at different temperature. The values of relaxation time have been higher towards the low temperature. The higher values of capacitance at low frequencies were attributed to the excess capacitance resulting from the interface states in equilibrium with the n-Si that can follow the Ac signal. (c) 2005 Elsevier Ltd. All rights reserved.

引用

页码：6148 / 6153

页数：6

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