Three-dimensional materials analysis by confocal Raman microspectroscopy

被引:18
作者
Kador, L
Schittkowski, T
Bauer, M
Fan, YW
机构
[1] Univ Bayreuth, Inst Phys, D-95440 Bayreuth, Germany
[2] Bayreuther Inst Makromol Forsch, D-95440 Bayreuth, Germany
关键词
D O I
10.1364/AO.40.004965
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Two- and three-dimensional spatial analysis of various composite materials was performed with a scanning confocal Raman microspectrometer. Samples include TiO2 microparticles, mixtures of polymers and the surface of an older Eprom computer chip. In the last case both structural and compositional information was obtained by means of comparing the signal intensity of the Rayleigh line with that of the silicon Raman line at 520 cm(-1). The spatial compositions of a pain-relief medicine and a pharmaceutical salt mixture could be visualized from characteristic Raman lines of the components. (C) 2001 Optical Society of America.
引用
收藏
页码:4965 / 4970
页数:6
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