Crystal stress dynamics by means of nanosecond time-resolved x-ray diffraction

被引：6

作者：

Chen, P

Tomov, IV

Rentzepis, PM

机构：

[1] Department of Chemistry, University of California, Irvine

来源：

APPLIED PHYSICS LETTERS | 1997年 / 71卷 / 12期

关键词：

D O I：

10.1063/1.120005

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Time-resolved transient lattice deformation in Pt (111) crystal has been directly observed from the shift of a nanosecond x-ray diffraction rocking curve. The development of a tabletop nanosecond x-ray system, which consists of an excimer laser, x-ray diode, and charge coupled device detector is described. With this system, we observed the time-dependent strain distribution during the laser heating process in the bulk of a Pt (111) crystal. This method provides a means of relative low cost for the study of fast transient properties and structures of materials. (C) 1997 American Institute of Physics.

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页码：1646 / 1648

页数：3

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