Nanomechanical characterization by double-pass force-distance mapping

被引：4

作者：

Dagdas, Yavuz S. ^{[1
]}

Aslan, M. Necip ^{[2
]}

Tekinay, Ayse B. ^{[1
]}

Guler, Mustafa O. ^{[1
]}

Dana, Aykutlu ^{[1
]}

机构：

[1] Bilkent Univ, UNAM Inst Mat Sci & Nanotechnol, TR-06800 Ankara, Turkey

[2] Istanbul Tech Univ, Dept Phys, TR-80626 Istanbul, Turkey

来源：

NANOTECHNOLOGY | 2011年 / 22卷 / 29期

关键词：

MICROSCOPY; ADHESION; SURFACE;

D O I：

10.1088/0957-4484/22/29/295704

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

We demonstrate high speed force-distance mapping using a double-pass scheme. The topography is measured in tapping mode in the first pass and this information is used in the second pass to move the tip over the sample. In the second pass, the cantilever dither signal is turned off and the sample is vibrated. Rapid (few kHz frequency) force-distance curves can be recorded with small peak interaction force, and can be processed into an image. Such a double-pass measurement eliminates the need for feedback during force-distance measurements. The method is demonstrated on self-assembled peptidic nanofibers.

引用

页数：5

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