Nanometer-scale surface modification using the scanning probe microscope: Progress since 1991

被引:224
作者
Nyffenegger, RM [1 ]
Penner, RM [1 ]
机构
[1] UNIV CALIF IRVINE, DEPT CHEM, INST SURFACE & INTERFACE SCI, IRVINE, CA 92697 USA
关键词
D O I
10.1021/cr960069i
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
引用
收藏
页码:1195 / 1230
页数:36
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共 354 条
[1]   NANOMETER-SCALE PIT FORMATION BY SCANNING-TUNNELING-MICROSCOPY ON GRAPHITE SURFACE AND TIP CURRENT MEASUREMENTS [J].
ABE, T ;
HANE, K ;
OKUMA, S .
JOURNAL OF APPLIED PHYSICS, 1994, 75 (02) :1228-1230
[2]   Pit and mound formation on arc-evaporated carbon thin film using scanning tunneling microscopy [J].
Abe, T ;
Hane, K ;
Okuma, S .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1996, 35 (03) :1850-1856
[3]  
ABE T, 1995, INT J JPN S PREC ENG, V29, P123
[4]   NANOSCALE STM-PATTERNING AND CHEMICAL MODIFICATION OF THE SI(100) SURFACE [J].
ABELN, GC ;
SHEN, TC ;
TUCKER, JR ;
LYDING, JW .
MICROELECTRONIC ENGINEERING, 1995, 27 (1-4) :23-26
[5]   ELECTROCHEMICAL SURFACE ALLOYING OF SILVER ON PT(100) - LEED AND AUGER STUDY [J].
ABERDAM, D ;
SALEM, C ;
DURAND, R ;
FAURE, R .
SURFACE SCIENCE, 1990, 239 (1-2) :71-84
[6]   SURFACE MODIFICATION WITH THE SCANNING TUNNELING MICROSCOPE [J].
ABRAHAM, DW ;
MAMIN, HJ ;
GANZ, E ;
CLARKE, J .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (05) :492-499
[7]   TRIANGULAR STRUCTURES ON TUNGSTEN DISELENIDE INDUCED AND OBSERVED BY SCANNING TUNNELING MICROSCOPY [J].
AKARI, S ;
MOLLER, R ;
DRANSFELD, K .
APPLIED PHYSICS LETTERS, 1991, 59 (02) :243-245
[8]   NANOMETER-SCALE HOLE FORMATION ON GRAPHITE USING A SCANNING TUNNELING MICROSCOPE [J].
ALBRECHT, TR ;
DOVEK, MM ;
KIRK, MD ;
LANG, CA ;
QUATE, CF ;
SMITH, DPE .
APPLIED PHYSICS LETTERS, 1989, 55 (17) :1727-1729
[9]   Semiconductor clusters, nanocrystals, and quantum dots [J].
Alivisatos, AP .
SCIENCE, 1996, 271 (5251) :933-937
[10]   DATA ACQUISITION AND CONTROL-SYSTEM FOR MOLECULE AND ATOM-RESOLVED TUNNELING SPECTROSCOPY [J].
ALTMAN, EI ;
DILELLA, DP ;
IBE, J ;
LEE, K ;
COLTON, RJ .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (05) :1239-1243