The application of atomic force microscopy force measurements to the characterisation of microbial surfaces

被引:57
作者
Wright, Chris J. [1 ]
Armstrong, Ian [1 ]
机构
[1] Univ Wales Swansea, Multidisciplinary Nanotechnol Ctr, Swansea, W Glam, Wales
关键词
adhesion; aggregation; atomic force microscopy; AFM; cell surface; force measurements; microbiology; molecular interactions; nanomechanics;
D O I
10.1002/sia.2506
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The interaction of microbes and subsequent development of biofilms at surfaces has far-reaching consequences in bioprocess engineering, agriculture, medicine and dentistry. Thus, the microbial surface has been the focus of wide scientific investigation. However, only recently has technology permitted quantitative study of the molecular interactions that govern the interactions of microbes. One such technology is atomic force microscopy (AFM) that not only permits the high resolution imaging of microbial surfaces but also the direct measurement of molecular forces and physical properties found at the microbial surface. This review highlights the current development of AFM force measurements and how these may be applied to microbial cell surfaces. The refinement of the AFM force measurement technique for characterising microbial surfaces will be discussed with reference to selected studies from the author's laboratory and key results from other research teams. The review will demonstrate how the application of the AFM techniques of single-molecule force spectroscopy, functionalised tips, cell probes and lateral force measurement to microbial surfaces has provided exciting and unique insights into the microbial surface and its interactions. Copyright (C) 2006 John Wiley & Sons, Ltd.
引用
收藏
页码:1419 / 1428
页数:10
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