Electron impact ionization of Be+ and photoionization of Be at the K edge

被引:38
作者
Berrington, K
Pelan, J
Quigley, L
机构
[1] Dept. Appl. Math. and Theor. Phys., Queen's University
关键词
D O I
10.1088/0953-4075/30/21/030
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We present new R-matrix calculations for ionization processes involving the beryllium K-shell, namely electron impact ionization of Be+ 1s(2)2s and single and double photoionization of Be. These are modelled near inner-shell thresholds in a unified way, coupling direct and indirect processes, enabling:comparison of the respective autoionization features. Below the K edge, we predict that direct double photoionization contributes 4% to the total cross section background for photoionizing Be; the onset of K-shell excitation-autoionization (EA), an indirect mechanism, increases the background by a factor 20. By contrast, we find that EA in e(-) + Be+ ionization increases its background by only 4%; this is less than previous estimates, but in line with experiment. We also study high-energy behaviour for photoionizing excited states, e.g. Be 1s(2)2sns, where we find a background dominated by 2s --> epsilon p ionization. This process is normally omitted in R-matrix schemes used in opacity and recombination calculations, leading to orders-of-magnitude underestimation at high energies of excited-state photoionization, which also exhibits a large 1s --> 2p core resonance above the K edge.
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收藏
页码:4973 / 4990
页数:18
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