Determination of the refractive index and thickness of holographic silver halide materials by use of polarized reflectances

被引:12
作者
Beléndez, A
Beléndez, T
Neipp, C
Pascual, I
机构
[1] Univ Alicante, Dept Fis Ingn Sistemas & Teoria Senal, E-03080 Alicante, Spain
[2] Univ Miguel Hernandez, Dept Ciencia & Tecnol Mat, E-03202 Elche, Spain
[3] Univ Alicante, Dept Interuniv Opt, E-03080 Alicante, Spain
关键词
D O I
10.1364/AO.41.006802
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A method to determine the refractive index and thickness of silver halide emulsions used in holography is presented. The emulsions are in the form of a layer of film deposited on a thick glass plate. The experimental reflectances of p-polarized light are measured as a function of the incident angles, and the values of refractive index, thickness, and extinction coefficient of the emulsion are obtained by using the theoretical equation for reflectance. As examples, five commercial holographic silver halide emulsions are analyzed. The procedure to obtain the measurements and the numerical analysis of the experimental data are simple, and agreement of the calculated reflectances, by use of the thickness and refractive index obtained, with the measured reflectances is satisfactory. (C) 2002 Optical Society of America.
引用
收藏
页码:6802 / 6808
页数:7
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