Phase fields of nickel silicides obtained by mechanical alloying in the nanocrystalline state

被引:42
作者
Datta, MK [1 ]
Pabi, SK [1 ]
Murty, BS [1 ]
机构
[1] Indian Inst Technol, Dept Met & Mat Engn, Kharagpur 721302, W Bengal, India
关键词
D O I
10.1063/1.373553
中图分类号
O59 [应用物理学];
学科分类号
摘要
Solid state reactions induced by mechanical alloying (MA) of elemental blends of Ni and Si have been studied over the entire composition range of the Ni-Si system. A monotonous increase of the lattice parameter of the Ni rich solid solution, Ni(Si), is observed with refinement of crystallite size. Nanocrystalline phase/phase mixtures of Ni(Si), Ni(Si)+Ni31Si12, Ni31Si12+Ni2Si, Ni2Si+NiSi and NiSi+Si, have been obtained during MA, over the composition ranges of 0-10, 10-28, 28-33, 33-50, and > 50 at. % Si, respectively. The results clearly suggest that only congruent melting phases, Ni31Si12, Ni2Si, and NiSi form, while the formation of noncongruent melting phases, Ni3Si, Ni3Si2, and NiSi2, is bypassed in the nanocrystalline state. The phase formation during MA has been discussed based on thermodynamic arguments. The predicted phase fields obtained from effective free energy calculations are quite consistent with those obtained during MA. (C) 2000 American Institute of Physics. [S0021-8979(00)00412-6].
引用
收藏
页码:8393 / 8400
页数:8
相关论文
共 36 条
[1]
MECHANICAL MILLING OF ORDERED INTERMETALLIC COMPOUNDS - THE ROLE OF DEFECTS IN AMORPHIZATION [J].
CHO, YS ;
KOCH, CC .
JOURNAL OF ALLOYS AND COMPOUNDS, 1993, 194 (02) :287-294
[2]
NUCLEATION-LIMITED PHASE SELECTION DURING REACTIONS IN NICKEL AMORPHOUS-SILICON MULTILAYER THIN-FILMS [J].
CLEVENGER, LA ;
THOMPSON, CV .
JOURNAL OF APPLIED PHYSICS, 1990, 67 (03) :1325-1333
[3]
DATTA MK, IN PRESS MAT SCI E A
[4]
DEBOER FR, 1988, COHESION METALS, V1
[5]
USE OF THE VOIGT FUNCTION IN A SINGLE-LINE METHOD FOR THE ANALYSIS OF X-RAY-DIFFRACTION LINE BROADENING [J].
DEKEIJSER, TH ;
LANGFORD, JI ;
MITTEMEIJER, EJ ;
VOGELS, ABP .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1982, 15 (JUN) :308-314
[6]
SUPPRESSION OF CRYSTAL NUCLEATION IN AMORPHOUS LAYERS WITH SHARP CONCENTRATION GRADIENTS [J].
DESRE, PJ ;
YAVARI, AR .
PHYSICAL REVIEW LETTERS, 1990, 64 (13) :1533-1536
[7]
Nanostructure formation by mechanical attrition [J].
Fecht, HJ .
NANOSTRUCTURED MATERIALS, 1995, 6 (1-4) :33-42
[8]
STRUCTURAL CHARACTERIZATION OF NANOMETER-SIZED CRYSTALLINE PD BY X-RAY-DIFFRACTION TECHNIQUES [J].
FITZSIMMONS, MR ;
EASTMAN, JA ;
MULLERSTACH, M ;
WALLNER, G .
PHYSICAL REVIEW B, 1991, 44 (06) :2452-2460
[9]
FROES FH, 1995, MAT SCI ENG A-STRUCT, V192, P612, DOI 10.1016/0921-5093(94)03285-8
[10]
GROWTH-KINETICS OF PLANAR BINARY DIFFUSION COUPLES - THIN-FILM CASE VERSUS BULK CASES [J].
GOSELE, U ;
TU, KN .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (04) :3252-3260