Quantitative analysis of dynamic-force-spectroscopy data on graphite(0001) in the contact and noncontact regimes

被引：68

作者：

Hölscher, H

Schwarz, A

Allers, W

Schwarz, UD

Wiesendanger, R

机构：

[1] Univ Hamburg, Inst Appl Phys, D-20355 Hamburg, Germany

[2] Univ Hamburg, Microstruct Res Ctr, D-20355 Hamburg, Germany

来源：

PHYSICAL REVIEW B | 2000年 / 61卷 / 19期

关键词：

D O I：

10.1103/PhysRevB.61.12678

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We present a comparative experimental and theoretical study of the frequency shift in ultrahigh vacuum dynamic force microscopy at 80 K on graphite(0001) measured as a function of the tip-sample distance for different resonance amplitudes A in the repulsive and attractive regime of the tip-sample Forces. The resulting frequency shift versus distance curves scale with 1/A(3/2) over the full range. We determined the tip-sample force from the frequency shift versus distance curves and found good agreement with specific force laws for long-range (van der Waals), short-range (Lennard-Jones), and contact (Hertz) forces.

引用

收藏

页码：12678 / 12681

页数：4

相关论文

共 24 条

[1] FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].

ALBRECHT, TR ;

GRUTTER, P ;

HORNE, D ;

RUGAR, D .

JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :668-673

[2] Dynamic scanning force microscopy at low temperatures on a noble-gas crystal: Atomic resolution on the xenon(111) surface [J].

Allers, W ;

Schwarz, A ;

Schwarz, UD ;

Wiesendanger, R .

EUROPHYSICS LETTERS, 1999, 48 (03) :276-279

[3] Dynamic scanning force microscopy at low temperatures on a van der Waals surface: graphite (0001) [J].

Allers, W ;

Schwarz, A ;

Schwarz, UD ;

Wiesendanger, R .

APPLIED SURFACE SCIENCE, 1999, 140 (3-4) :247-252

[4] Scanning force microscope with atomic resolution in ultrahigh vacuum and at low temperatures [J].

Allers, W ;

Schwarz, A ;

Schwarz, UD ;

Wiesendanger, R .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (01) :221-225

[5] ATOMIC FORCE MICROSCOPE [J].

BINNIG, G ;

QUATE, CF ;

GERBER, C .

PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933

[6] 7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE [J].

BINNIG, G ;

ROHRER, H ;

GERBER, C ;

WEIBEL, E .

PHYSICAL REVIEW LETTERS, 1983, 50 (02) :120-123

[7] Adhesion interaction between atomically defined tip and sample [J].

Cross, G ;

Schirmeisen, A ;

Stalder, A ;

Grutter, P ;

Tschudy, M ;

Durig, U .

PHYSICAL REVIEW LETTERS, 1998, 80 (21) :4685-4688

[8] EFFECT OF CONTACT DEFORMATIONS ON ADHESION OF PARTICLES [J].

DERJAGUIN, BV ;

MULLER, VM ;

TOPOROV, YP .

JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1975, 53 (02) :314-326

[9] Relations between interaction force and frequency shift in large-amplitude dynamic force microscopy [J].

Dürig, U .

APPLIED PHYSICS LETTERS, 1999, 75 (03) :433-435

[10] Atomic force microscopy study of an ideally hard contact: The diamond(111) tungsten carbide interface [J].

Enachescu, M ;

van den Oetelaar, RJA ;

Carpick, RW ;

Ogletree, DF ;

Flipse, CFJ ;

Salmeron, M .

PHYSICAL REVIEW LETTERS, 1998, 81 (09) :1877-1880