Microstructures and characteristics of deep trap levels in ZnO varistors doped with Y2O3

被引:26
作者
Liu Jun [1 ]
Hu Jun [1 ]
He JinLiang [1 ]
Lin YuanHua [2 ]
Long WangCheng [1 ]
机构
[1] Tsinghua Univ, Dept Elect Engn, State Key Lab Power Syst, Beijing 100084, Peoples R China
[2] Tsinghua Univ, Dept Mat Sci & Engn, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
来源
SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES | 2009年 / 52卷 / 12期
基金
中国国家自然科学基金;
关键词
ZnO; varistors; Y2O3; electrical properties; deep trap levels; ZINC-OXIDE VARISTORS; GRAIN-BOUNDARIES; VOLTAGE GRADIENT; CERAMICS; SEMICONDUCTORS;
D O I
10.1007/s11431-009-0369-9
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper discussions on ZnO based varistor ceramics doped with different ratios of Y2O3 are presented. Analysis on the phase and microstructures of the samples indicates that an additional phase is detected in the samples doped with Y2O3, and the average grain size of the specimens decreases from about 9.2 mu m to 4.5 mu m, with an increase in the addition of Y2O3 from 0 mol% to 3 mol%. The corresponding varistor's voltage gradient markedly increases from 462 V/mm to 2340 V/mm, while the nonlinear coefficient decreases from 22.3 to 11.5, respectively. Furthermore, the characteristics of deep trap levels in these ZnO samples are investigated by measuring their dielectric spectroscopies. The trap energy level and capture cross section evaluated by relaxation peak of the Cole-Cole plot vary slightly as the addition of Y2O3 increases. These traps may be ascribed to the intrinsic defects of ZnO lattice.
引用
收藏
页码:3668 / 3673
页数:6
相关论文
共 15 条
[1]  
ABDULLAH KA, 1991, J APPL PHYS, V69, P4046
[2]   Electrical barriers in the ZnO varistor grain boundaries [J].
Alim, MA ;
Li, ST ;
Liu, FY ;
Cheng, PF .
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2006, 203 (02) :410-427
[3]   COMPLEX-PLANE ANALYSIS OF TRAPPING PHENOMENA IN ZINC-OXIDE BASED VARISTOR GRAIN-BOUNDARIES [J].
ALIM, MA ;
SEITZ, MA ;
HIRTHE, RW .
JOURNAL OF APPLIED PHYSICS, 1988, 63 (07) :2337-2345
[4]   The characteristics of ZnO-Bi2O3-based varistor ceramics doped withY2O3 and varying amounts of Sb2O3 [J].
Bernik, S ;
Macek, S ;
Bui, A .
JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 2004, 24 (06) :1195-1198
[5]   Microstructural and electrical characteristics of Y2O3-doped ZnO-Bi2O3-based varistor ceramics [J].
Bernik, S ;
Macek, S ;
Ai, B .
JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 2001, 21 (10-11) :1875-1878
[6]   CARRIER TRANSPORT THROUGH GRAIN-BOUNDARIES IN SEMICONDUCTORS [J].
BLATTER, G ;
GREUTER, F .
PHYSICAL REVIEW B, 1986, 33 (06) :3952-3966
[7]   Admittance and dielectric spectroscopy of polycrystalline semiconductors [J].
Bueno, Paulo R. ;
Varela, Jose A. ;
Longo, Elson .
JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 2007, 27 (13-15) :4313-4320
[8]  
Clarke DR, 1999, J AM CERAM SOC, V82, P485
[9]   BULK ELECTRON TRAPS IN ZINC-OXIDE VARISTORS [J].
CORDARO, JF ;
SHIM, Y ;
MAY, JE .
JOURNAL OF APPLIED PHYSICS, 1986, 60 (12) :4186-4190
[10]  
DANIEL VV, 1967, EMPIRICAL METHODS EV, P95