The impact of self-aligned amorphous Si thin film transistors on imager array applications

被引:5
作者
Lu, JP [1 ]
Mei, P [1 ]
Rahn, J [1 ]
Ho, J [1 ]
Wang, Y [1 ]
Boyce, JB [1 ]
Street, RA [1 ]
机构
[1] Xerox Palo Alto Res Ctr, Palo Alto, CA 94304 USA
关键词
D O I
10.1016/S0022-3093(99)00940-0
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Laser processing allows the fabrication of self-aligned amorphous Si thin film transistors (a-Si:H TFTs). These devices have much smaller parasitic capacitance between gates and source/drain contacts and can have much shorter channel lengths compared to the conventional a-Si:H TFTs. We have fabricated matrix-addressed, optical imager arrays using these new a-Si:H TFTs as pixel switches. We also have demonstrated that four-phase dynamic shift registers using short channel a-Si:K TFTs can be operated at a clock speed of 400 kHz (less than 0.625 mu s for each clock phase), indicating the possibility of integrating some of the peripheral circuits based oil a-Si:H TFT technology. The advantages of using self-aligned a-Si TFTs as pixel switches in large-area, flat-panel imagers are discussed. Improved noise performance is expected for large area imager arrays. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:1294 / 1298
页数:5
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