Phase modulating zone plates for x-rays of energy 1-8 keV

被引：2

作者：

Michette, AG

Buckley, CJ

Pfauntsch, SJ

机构：

[1] Centre for X-Ray Science, Department of Physics, King's College, London WC2R 2LS, Strand

来源：

OPTICS COMMUNICATIONS | 1997年 / 141卷 / 3-4期

关键词：

X-ray microscopy; zone plate optics;

D O I：

10.1016/S0030-4018(97)00227-7

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The use of phase modulating zone plates as objective optics for X-ray microscopy in the energy range 1-8 keV is considered, and a new analytic method for determining the optimum zone thickness is derived. The advantages, in terms of manufacture and ease of use. of using the second diffraction order of the zone plate, instead of the first, are discussed. (C) 1997 Elsevier Science B.V.

引用

页码：118 / 122

页数：5

共 15 条

[1] CHEMICAL CONTRAST IN X-RAY MICROSCOPY AND SPATIALLY RESOLVED XANES SPECTROSCOPY OF ORGANIC SPECIMENS [J].