Diameter-dependent evolution of failure current density of highly conducting DNA-templated gold nanowires

被引：27

作者：

Aherne, Damian

Satti, Amro

Fitzmaurice, Donald

机构：

[1] Univ Dublin Trinity Coll, Ctr Res Adapt Nanostruct & Nanodevices, Dublin 2, Ireland

[2] Univ Coll Dublin, Sch Chem & Chem Biol, Dublin 4, Ireland

来源：

NANOTECHNOLOGY | 2007年 / 18卷 / 12期

关键词：

D O I：

10.1088/0957-4484/18/12/125205

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

In this paper we report on the evolution of the failure current density as a function of diameter for highly conducting DNA-templated gold nanowires. This is explained as an increased ability of narrower nanowires to mitigate electromigration stresses, arising from an evolution of the structure of the nanowires from polygranular to bamboo-like as diameter decreases. The narrowest nanowires withstand current densities up to 3.3 x 10(12) A m(-2) before undergoing failure by melting.

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页数：6

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