MOVPE growth and real structure of vertical-aligned GaAs nanowires

被引:41
作者
Bauer, J.
Gottschalch, V.
Paetzelt, H.
Wagner, G.
Fuhrmann, B.
Leipner, H. S.
机构
[1] Univ Leipzig, Inst Anorgan Chem, D-04103 Leipzig, Germany
[2] Univ Leipzig, Inst Kristallog & Mineral, D-04103 Leipzig, Germany
[3] Univ Halle Wittenberg, D-06099 Halle, Saale, Germany
关键词
nanostructures; metal-organic vapor phase epitaxy; semiconducting gallium arsenide;
D O I
10.1016/j.jcrysgro.2006.10.082
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
We studied the influence of the substrate preparation and the growth conditions important to fabricate GaAs nanowires (NWs) with metal-organic vapor phase epitaxy. The growth parameters temperature, precursor partial pressures and growth duration were investigated. The definite choice of the V/III ratio enables NW length growth independent on the diameter. By investigating the temporal evolution of the GaAs-NW growth a diameter-dependent growth rate could be determined. Applying nanosphere lithography arranged GaAs-NW arrays were achieved. The NWs morphology and real structure was investigated using (high-resolution) transmission electron microscopy and selective area diffraction. The twin formation in GaAs NWs was investigated. A crystallographic model is presented. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:625 / 630
页数:6
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