Interaction forces between a glass surface and silica-modified PMMA-based abrasives for CMP measured by colloidal AFM

被引:9
作者
Armini, Silvia [1 ]
Burtovyy, Ruslan
Luzinov, Igor
Whelan, Caroline M.
Maex, Karen
Moinpour, Mansour
机构
[1] Katholieke Univ Leuven, Dept Elect Engn, B-3001 Heverlee, Belgium
[2] IMEC, B-3001 Louvain, Belgium
[3] Clemson Univ, Sch Mat Sci & Engn, Clemson, SC 29634 USA
[4] Intel Corp, Santa Clara, CA 95052 USA
关键词
D O I
10.1149/1.2402982
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 [应用化学];
摘要
Interaction forces between a glass surface and two types of silica-coated poly(methyl methacrylate)(PMMA)-based terpolymer abrasive particles were investigated using colloidal atomic force microscopy (AFM) and correlated with relevant chemical mechanical planarization (CMP) and post-CMP parameters. Based on the average values of the pull-off force vs pH, the interaction between a glass bead and the composites can be considered as a silica-glass interaction, as confirmed by zeta potential measurements. The increase in repulsive force with increasing pH corresponds to a decrease in composite-glass adhesion. For pH between 2 and 7, the electrostatic attractive forces between polymer particles and silica surface are responsible for high particle counts. (c) 2006 The Electrochemical Society.
引用
收藏
页码:H74 / H78
页数:5
相关论文
共 25 条
[1]
ARMINI S, IN PRESS LANGMUIR
[2]
ARMINI S, 2006, POLYM J TOKYO, V8, P786
[3]
Mixed polymer brushes by sequential polymer addition: Anchoring layer effect [J].
Draper, J ;
Luzinov, I ;
Minko, S ;
Tokarev, I ;
Stamm, M .
LANGMUIR, 2004, 20 (10) :4064-4075
[4]
HETEROCOAGULATION BEHAVIOR OF POLYMER LATTICES WITH SPHERICAL SILICA [J].
FURUSAWA, K ;
ANZAI, C .
COLLOIDS AND SURFACES, 1992, 63 (1-2) :103-111
[5]
Particle adhesion force distributions on rough surfaces [J].
Götzinger, M ;
Peukert, W .
LANGMUIR, 2004, 20 (13) :5298-5303
[6]
APPLICATION OF MAGNETIC BEADS IN BIOASSAYS [J].
HAUKANES, BI ;
KVAM, C .
BIO-TECHNOLOGY, 1993, 11 (01) :60-63
[7]
Study of surface charge effects on oxide and nitride planarization using alumina/ceria mixed abrasive slurries [J].
Hegdea, S ;
Babu, SV .
ELECTROCHEMICAL AND SOLID STATE LETTERS, 2004, 7 (12) :G316-G318
[8]
Israelachvili J. N., 1992, INTERMOLECULAR SURFA
[9]
Chemical mechanical polishing of dielectric films using mixed abrasive slurries [J].
Jindal, A ;
Hegde, S ;
Babu, SV .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2003, 150 (05) :G314-G318
[10]
Adhesion forces between glass and silicon surfaces in air studied by AFM: Effects of relative humidity, particle size, roughness, and surface treatment [J].
Jones, R ;
Pollock, HM ;
Cleaver, JAS ;
Hodges, CS .
LANGMUIR, 2002, 18 (21) :8045-8055