Characterization of ZrO2/Y2O3 laser ablation plasma in vacuum, oxygen, and argon environments

被引:47
作者
Voevodin, AA [1 ]
Jones, JG [1 ]
Zabinski, JS [1 ]
机构
[1] USAF, MLBT, MLMR, AF Res Lab,Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
关键词
D O I
10.1063/1.373781
中图分类号
O59 [应用物理学];
学科分类号
摘要
Laser ablation deposition of highly oriented yttria stabilized zirconia (YSZ) films is important for various technological applications and depends critically on the selection of background environment, with low pressure oxygen being the most common choice. Here, the spatial-temporal distribution of YSZ plume chemistry, excitation states, and energy was determined for ablations in vacuum, low pressure O-2, and low pressure Ar, using fluorescence analyses, element specific imaging techniques, and time-of-flight experiments. It was found that an Ar background considerably promotes excitation and ionization of zirconium during the first 1-3 mu s after the laser strike. There is much less zirconium excitation in an O-2 background, where a large fraction of atomic oxygen with a broad spatial distribution was found. ZrO and YO molecules were observed in both environments. Their highest concentrations were in the O-2 background, where fluorescence from these molecules near the substrate lasted for 2-5 mu s. Neutral species in YSZ plumes were fitted to Maxwellian type velocity distributions with a shifted center of mass. Kinetic energies derived from the fitted data were reduced by about a factor of 2 in Ar and O-2 backgrounds compared to in vacuum. This was not observed for Zr1+ species, which maintained about 100-120 eV mean kinetic energy nearly independently of the background. The ionization of Zr in the presence of Ar, the high velocity of ionized Zr atoms relative to the rest of the plume, the generation of molecular ZrO, YO, and atomic oxygen in the presence of O-2 are potentially important for chemistry and structure control of YSZ films. (C) 2000 American Institute of Physics. [S0021-8979(00)01014-8].
引用
收藏
页码:1088 / 1096
页数:9
相关论文
共 26 条
[1]   YBCO/YSZ coated conductors on flexible Ni alloy substrates [J].
Arendt, PN ;
Foltyn, SR ;
Groves, JR ;
DePaula, RF ;
Dowden, PC ;
Roper, JM ;
Coulter, JY .
APPLIED SUPERCONDUCTIVITY, 1996, 4 (10-11) :429-434
[2]   Processing dependence of biaxial texture in yttria-stabilized zirconia by ion-beam-assisted deposition [J].
Chudzik, MP ;
Erck, R ;
Lanagan, MT ;
Kannewurf, CR .
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 1999, 9 (02) :1490-1493
[3]   Structural properties of yttria-stabilized zirconia thin films grown by pulsed laser deposition [J].
Dai, JY ;
Ong, HC ;
Chang, RPH .
JOURNAL OF MATERIALS RESEARCH, 1999, 14 (04) :1329-1336
[4]   ArF and KrF excimer laser deposition of yttria-stabilized zirconia on Si(100) [J].
Delgado, JC ;
Sanchez, F ;
Aguiar, R ;
Maniette, Y ;
Ferrater, C ;
Varela, M .
APPLIED PHYSICS LETTERS, 1996, 68 (08) :1048-1050
[5]   WEAR MECHANISMS OF AMORPHOUS-CARBON AND ZIRCONIA COATINGS ON RIGID DISK MAGNETIC RECORDING MEDIA [J].
DUGGER, MT ;
CHUNG, YW ;
BHUSHAN, B ;
ROTHSCHILD, W .
TRIBOLOGY TRANSACTIONS, 1993, 36 (01) :84-94
[6]   EPITAXIAL YTTRIA-STABILIZED ZIRCONIA ON HYDROGEN-TERMINATED SI BY PULSED LASER DEPOSITION [J].
FORK, DK ;
FENNER, DB ;
CONNELL, GAN ;
PHILLIPS, JM ;
GEBALLE, TH .
APPLIED PHYSICS LETTERS, 1990, 57 (11) :1137-1139
[7]  
Gaydon A.G., 1976, IDENTIFICATION MOL S, P407
[8]  
Geohegan D.B., 1994, PULSED LASER DEPOSIT, P115
[9]   In situ plume-emission monitoring during pulsed-laser deposition of YBa2Cu3O7-delta and yttria-stabilized zirconia thin films [J].
Gores, J ;
Kung, PJ ;
Fenner, DB ;
Budnick, JI .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1997, 68 (01) :170-177
[10]   A HIGH INTENSITY SOURCE FOR THE MOLECULAR BEAM .1. THEORETICAL [J].
KANTROWITZ, A ;
GREY, J .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1951, 22 (05) :328-332