High room-temperature photoluminescence of one-dimensional Ta2O5 nanorod arrays

被引:58
作者
Devan, Rupesh S. [1 ]
Ho, Wei-Der [1 ]
Chen, Chia-Hao [2 ]
Shiu, Hung-Wei [2 ]
Ho, Ching-Hwa [3 ]
Cheng, Chia-Liang [1 ]
Wu, Sheng Yun [1 ]
Liou, Yung [4 ]
Ma, Yuan-Ron [1 ]
机构
[1] Natl Dong Hwa Univ, Dept Phys, Shoufeng 97401, Hualien, Taiwan
[2] Natl Synchrotron Radiat Res Ctr, Hsinchu 300, Taiwan
[3] Natl Dong Hwa Univ, Dept Mat Sci & Engn, Hualien 97401, Taiwan
[4] Acad Sinica, Inst Phys, Taipei 11529, Taiwan
关键词
STIMULATED CURRENT SPECTROSCOPY; RAY PHOTOELECTRON-SPECTROSCOPY; SILICON SOLAR-CELLS; TANTALUM PENTOXIDE; THIN-FILMS; RAMAN-SCATTERING; OXYGEN VACANCY; OPTICAL-PROPERTIES; REFRACTIVE-INDEX; DEFECT STATES;
D O I
10.1088/0957-4484/20/44/445708
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this study we analyzed the structural and electronic properties of a new morphological form, one-dimensional (1D) Ta2O5 nanorod arrays, which were synthesized by hot filament metal vapor deposition. Field-emission scanning electron microscopy (FESEM) showed the 1D Ta2O5 nanorods to be arranged in a large-area high-density array about 50 nm wide and approximately 550 nm long. X-ray photoemission spectroscopy (XPS) revealed not only the electronic structures and chemical properties of the 1D Ta2O5 nanorods but also their stoichiometric Ta and O compositions. Photoluminescence (PL) spectra showed intensive green-light, yellow-light and red-light emissions at room temperature. These emissions simultaneously emerged from the trap levels of oxygen vacancies within the Ta2O5 bandgap. The emission results strongly indicate that the 1D Ta2O5 nanorods are good room-temperature visible-light emitters.
引用
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页数:5
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共 53 条
[1]   Characterization of Ta2O5 thin films prepared by reactive evaporation [J].
Asghar, M. H. ;
Placido, F. ;
Naseem, S. .
EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, 2006, 36 (02) :119-124
[2]   XPS study of N2 annealing effect on thermal Ta2O5 layers on Si [J].
Atanassova, E ;
Tyuliev, G ;
Paskaleva, A ;
Spassov, D ;
Kostov, K .
APPLIED SURFACE SCIENCE, 2004, 225 (1-4) :86-99
[3]   X-ray photoelectron spectroscopy of thermal thin Ta2O5 films on Si [J].
Atanassova, E ;
Spassov, D .
APPLIED SURFACE SCIENCE, 1998, 135 (1-4) :71-82
[4]   Thin RF sputtered and thermal Ta2O5 on Si for high density DRAM application [J].
Atanassova, E .
MICROELECTRONICS RELIABILITY, 1999, 39 (08) :1185-1217
[5]   Design and simulation of antireflection coating systems for optoelectronic devices: Application to silicon solar cells [J].
Bouhafs, D ;
Moussi, A ;
Chikouche, A ;
Ruiz, JM .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 1998, 52 (1-2) :79-93
[6]   X-ray photoelectron spectroscopy study of Al/Ta2O5 and Ta2O5/Al buried interfaces [J].
Chen, K ;
Yang, GR ;
Nielsen, M ;
Lu, TM ;
Rymaszewski, EJ .
APPLIED PHYSICS LETTERS, 1997, 70 (03) :399-401
[7]   Study of tantalum oxide thin film capacitors on metallized polymer sheets for advanced packaging applications [J].
Chen, K ;
Nielsen, M ;
Soss, S ;
Rymaszewski, EJ ;
Lu, TM ;
Wan, CT .
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART B-ADVANCED PACKAGING, 1997, 20 (02) :117-122
[8]   SiO2/Ta2O5 core-shell nanowires and nanotubes [J].
Chueh, Ya-Lun ;
Chou, Li-Jen ;
Wang, Zhong Lin .
ANGEWANDTE CHEMIE-INTERNATIONAL EDITION, 2006, 45 (46) :7773-7778
[9]   Improvements in anti-reflection coatings for high-efficiency silicon solar cells [J].
Cid, M ;
Stem, N ;
Brunetti, C ;
Beloto, AF ;
Ramos, CAS .
SURFACE & COATINGS TECHNOLOGY, 1998, 106 (2-3) :117-120
[10]   Influence of the porosity of RF sputtered Ta2O5 thin films on their optical properties for electrochromic applications [J].
Corbella, C ;
Vives, M ;
Pinyol, A ;
Porqueras, I ;
Person, C ;
Bertran, E .
SOLID STATE IONICS, 2003, 165 (1-4) :15-22