Polarization dependence of soft-x-ray Raman scattering at the L edge of TiO2

被引：78

作者：

Harada, Y ^{[1
]}

Kinugasa, T

Eguchi, R

Matsubara, M

Kotani, A

Watanabe, M

Yagishita, A

Shin, S

机构：

[1] Univ Tokyo, Inst Solid State Phys, Minato Ku, Tokyo 1068666, Japan

[2] Inst Mat Struct Sci, Photon Factory, Tsukuba, Ibaraki 3050801, Japan

来源：

PHYSICAL REVIEW B | 2000年 / 61卷 / 19期

关键词：

D O I：

10.1103/PhysRevB.61.12854

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Polarization dependence of soft-x-ray Raman scattering was investigated at the Ti 2p absorption edge of TiO2. Strong Raman scattering feature appears about 14 eV below elastic peaks with strong polarization dependence. These Raman scattering structures are charge transfer excitations to the antibonding state between 3d(1)L(-1) and 3d(0) states, because they are enhanced when the incident photon energies are tuned at satellite structures of Ti 2p absorption spectrum. Broad Raman scattering structures are found between 3 eV and 10 eV below elastic peaks. They are assigned to be nonbonding type charge transfer excitations or interband transition from O 2p valence to Ti 3d conduction bands, which includes the crystal field splitting in D-2h symmetry with two Ti-O bond lengths.

引用

页码：12854 / 12859

页数：6

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