Large-scale metrology - An update

被引：186

作者：

Estler, WT ^{[4
]}

Edmundson, KL

Peggs, GN

Parker, DH

机构：

[1] Geodet Serv Inc, Melbourne, FL USA

[2] Natl Phys Lab, Teddington TW11 0LW, Middx, England

[3] Natl Radio Astron Observ, Green Bank, WV USA

[4] Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA

来源：

CIRP ANNALS-MANUFACTURING TECHNOLOGY | 2002年 / 51卷 / 02期

关键词：

dimensional metrology; distance measurement; measurement uncertainty;

D O I：

10.1016/S0007-8506(07)61702-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Developments in large-scale engineering metrology since the 1978 report of Puttock are reviewed. Advances in optical technology and fast, low-cost computation have led to wide-spread use of laser trackers and digital photogrammetry for general-purpose coordinate metrology. Techniques for high-accuracy straightness measurement, precision leveling, and absolute distance metrology are described, together with approaches to compensation for the effects of atmospheric refraction. Methods for uncertainty evaluation are discussed and several illustrative examples are presented.

引用

页码：587 / 609

页数：23

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