Compressive yield strengths of nanocrystalline Cu and Pd

被引：109

作者：

Youngdahl, CJ ^{[1
]}

Sanders, PG ^{[1
]}

Eastman, JA ^{[1
]}

Weertman, JR ^{[1
]}

机构：

[1] ARGONNE NATL LAB,ARGONNE,IL 60439

来源：

SCRIPTA MATERIALIA | 1997年 / 37卷 / 06期

关键词：

D O I：

10.1016/S1359-6462(97)00157-7

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Compression tests were performed on disks of nanocrystalline Cu and Pd. The following observations have been made: • Yield strengths in compression of high density nanocrystalline Cu and Pd samples are very large, of the order of 1 GPa. • The strength is highly dependent on porosity, with a noticeable drop in σy associated with a 1-3% drop in density. • The compressive yield strength for a 98% dense Cu with grain size of 20 nm fits on the Hall-Petch curve extrapolated from coarse-grain data. • Nanocrystalline Cu and Pd samples, which are brittle in tension, undergo extensive compression before failure.

引用

页码：809 / 813

页数：5