Influence of planar defects on powder diffractograms of fcc metals

被引:9
作者
Ustinov, AI [1 ]
Budarina, NM [1 ]
机构
[1] Kiev Met Phys Inst, UA-03680 Kiev, Ukraine
关键词
X-ray powder diffraction; fcc crystal; planar defects;
D O I
10.1154/1.1523080
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
X-ray powder diffractograms from fcc crystals containing high concentration (more than 1%) of planar defects [deformation stacking faults (SF), double deformation SF, twin boundaries (TB)] have been simulated by Monte Carlo method in kinematic approach. It was shown that the characteristics of powder diffraction peak profiles (except peaks with indexes H00) dependent nonmonotonically on PD concentration, during which peak maximums stay in Bragg positions. An addition point to emphasize is that an appearance of TB only in the crystal not affects on position of all peaks. Several types of PD to be occurred simultaneously in the crystal influence on powder diffractograms additively. Peculiarities of the powder diffraction pattern inherent in different types of PD have been revealed to permit predominant PD type to be found with a high degree of accuracy based on experimental data. (C) 2002 International Centre for Diffraction Data.
引用
收藏
页码:270 / 277
页数:8
相关论文
共 31 条
[21]  
MIRZAEV DA, 1974, PHYS MET METALLOGR, V37, P912
[22]   STACKING FAULTS IN MARTENSITE OF CU-AL ALLOY [J].
NISHIYAM.Z ;
KAKINOKI, J ;
KAJIWARA, S .
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1965, 20 (07) :1192-&
[23]   X-RAY DIFFRACTION BY FACE-CENTERED CUBIC CRYSTALS WITH DEFORMATION FAULTS [J].
PATERSON, MS .
JOURNAL OF APPLIED PHYSICS, 1952, 23 (08) :805-811
[24]  
PUSHIN VG, 1993, PHYS MET METALLOGR, V75, P96
[25]  
THOLEN AR, 1986, PHILOS MAG A, V53, P259, DOI 10.1080/01418618608242825
[26]  
Ustinov AI, 2000, METALLOFIZ NOV TEKH+, V22, P28
[27]  
USTINOV AI, 1999, EFFECT PLANAR DEFECT
[28]  
WAGNER CNJ, 1965, T METALL SOC AIME, V233, P1280
[29]   THE EFFECT OF COLD-WORK DISTORTION ON X-RAY PATTERNS [J].
WARREN, BE ;
AVERBACH, BL .
JOURNAL OF APPLIED PHYSICS, 1950, 21 (06) :595-599
[30]  
WARREN BE, 1969, XRAY DIFFRACTION PRO, V5, P372