Benefits and limitations of immersion lithography

被引:55
作者
Mulkens, J
Flagello, D
Streefkerk, B
Graeupner, P
机构
[1] ASML, NL-5503 LA Veldhoven, Netherlands
[2] ASML, Tempe, AZ 85284 USA
[3] Carl Zeiss, D-73446 Oberkochen, Germany
来源
JOURNAL OF MICROLITHOGRAPHY MICROFABRICATION AND MICROSYSTEMS | 2004年 / 3卷 / 01期
关键词
immersion; high numerical aperture; polarization; depth of focus; per-fluor-polyethers;
D O I
10.1117/1.1636768
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Liquid immersion has been used for more than 100 years to increase the numeric aperture (NA) and resolution in optical microscopy. We explore the benefits and limitations of immersion technology in lithography. Immersion optical lithography has the potential to extend the resolution below 40 nm. The theory of immersion is decribed. Simulations show that a 193-nm immersion system at NA = 0.95 can double the depth of focus as compared to a dry system. Also, an immersion 193-nm system at NA = 1.05 has slightly more depth of focus than a 157-nm dry system at NA = 0.85. However, the exposure latitude at 193 nm is decreased due to the impact of polarization in imaging. Design schemes are presented to realize an immersion step and scan system. Two configuration approaches are proposed and explored. A localized shower type solution may be preferred over a bath type solution, because the impact on the step and scan platform design is significantly less. However, scanning over the wafer edge becomes the main design challenge with a shower solution. Studies are presented that look at the interaction of immersion fluids with the lens and the photoresist. Water seems to be a likely candidate, as it does not impact productivity of the step and scan system; however, focus and aberration levels need to be carefully controlled. For 157 nm, per-fluor-polyether (PFPE) materials are currently being studied, but their characteristics may limit the productivity of the exposure system. Further research on fluid candidates for 157-nm immersion is required. (C) 2004 Society of Photo-Optical Instrumentation Engineers.
引用
收藏
页码:104 / 114
页数:11
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