Energy dissipation in submicrometer thick single-crystal silicon cantilevers

被引:255
作者
Yang, JL
Ono, T
Esashi, M
机构
[1] Tohoku Univ, Venture Business Lab, Sendai, Miyagi 9808579, Japan
[2] Tohoku Univ, Fac Engn, Sendai, Miyagi 9808579, Japan
[3] Tohoku Univ, NICHE, Sendai, Miyagi 9808579, Japan
关键词
airdamping; cantilever; energy dissipation; single crystal silicon; support loss; surface loss; thermoelastic loss; ultra-thin Si;
D O I
10.1109/JMEMS.2002.805208
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper discusses four kinds of mechanical energy losses in ultrathin micro-cantilevers of 60 nm, 170 nm, and 500 nm in thickness: thermoelastic loss, air damping, support loss, and surface loss. For the cantilevers with thickness H < 500 nm and length L > 10 mum, thermoelastic loss is negligible. But it becomes significant when the beam thickness H > 500 nm and the length L < 10 mum. The cantilevers are very liable to air damping, hardly operated at pressure higher than 10(-3) mbar. In a high vacuum (<10(-3) mbar), air damping is negligible, the support and surface loss play an important role. The shorter the cantilevers, the larger the support energy loss. For the cantilevers with L/H < 100, the quality factors Q factors) are limited by the support loss. When the length L > 30 pm, the Q factors of the cantilevers are proportional to their thickness, i.e., surface loss dominates the mechanical behavior. Annealing the cantilevers of 170 nm thick at 1000 degreesC for 30 s under an ultrahigh vacuum (UHV) condition results in an over one order-of-magnitude increase of the Q factor, up to about 2.5 x 10(5) for cantilevers of 30-90 mum in length. The improvement of the Q factor was found to be associated with the deoxidization of the surface, as corroborated by X-ray photoelectron spectroscopy (XPS). With the promising mechanical behavior, the cantilever can easily be actuated by a laser beam (beam size: about 300 x 100 mum(2), wavelength: 680 nm) with power down to less than 40 muW, corresponding to 480 nW, i.e., 1.64 x 10(12) photons/s, irradiated on a cantilever surface (60 x 6 mum(2)). This provides a rather simple way to operate the ultrathin cantilevers dynamically in UHV. Atomic scale force resolution (4.8 x 10(-17) N) at 300 K is also expected with these cantilevers.
引用
收藏
页码:775 / 783
页数:9
相关论文
共 33 条
[1]   FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].
ALBRECHT, TR ;
GRUTTER, P ;
HORNE, D ;
RUGAR, D .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :668-673
[2]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[3]   DEPENDENCE OF THE QUALITY FACTOR OF MICROMACHINED SILICON BEAM RESONATORS ON PRESSURE AND GEOMETRY [J].
BLOM, FR ;
BOUWSTRA, S ;
ELWENSPOEK, M ;
FLUITMAN, JHJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1992, 10 (01) :19-26
[4]   SCANNING TUNNELING MICROSCOPY STUDY OF THE ADSORPTION AND RECOMBINATIVE DESORPTION OF HYDROGEN FROM THE SI(100)-2X1 SURFACE [J].
BOLAND, JJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1992, 10 (04) :2458-2464
[5]   ROLE OF BOND-STRAIN IN THE CHEMISTRY OF HYDROGEN ON THE SI(100) SURFACE [J].
BOLAND, JJ .
SURFACE SCIENCE, 1992, 261 (1-3) :17-28
[6]   STRUCTURE OF THE H-SATURATED SI(100) SURFACE [J].
BOLAND, JJ .
PHYSICAL REVIEW LETTERS, 1990, 65 (26) :3325-3328
[7]  
Cabuz C., 1994, THESIS TOHOKU U SEND
[8]   ESTIMATIONS OF THE CHARACTERISTICS OF GHZ RANGE NANOCANTILEVERS - EIGENFREQUENCIES AND QUALITY FACTORS [J].
GARCIA, N ;
LEVANYUK, AP ;
MINYUKOV, SA ;
BINH, VT .
SURFACE SCIENCE, 1995, 328 (03) :337-342
[9]  
GOTTLIEB SO, 1988, APPL PHYS LETT, V52, P907
[10]   Giant surface stress in heteroepitaxial films: Invalidation of a classical rule in epitaxy [J].
Grossmann, A ;
Erley, W ;
Hannon, JB ;
Ibach, H .
PHYSICAL REVIEW LETTERS, 1996, 77 (01) :127-130