Controlling the size, structure and orientation of semiconductor nanocrystals using metastable phase recrystallization

被引:98
作者
Budai, JD
White, CW
Withrow, SP
Chisholm, MF
Zhu, J
Zuhr, RA
机构
[1] Solid State Division, Oak Ridge National Laboratory, Oak Ridge
关键词
D O I
10.1038/37079
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Materials engineering at the nanometre scale should provide smaller technological devices than are currently available(1,2). In particular, research on semiconductor nanostructures with size-dependent optical and electronic properties is motivated by potential applications which include quantum-dot lasers and high-speed nonlinear optical switches(3,4). Here we describe an approach for controlling the size, orientation and lattice structure of semiconductor nanocrystals embedded in a transparent matrix. We form nanocrystalline precipitates by implanting ions of the semiconductor into a single-crystal alumina substrate and applying thermal annealing(5-7). Control over the microstructure of the nanocrystals is achieved using substrate amorphization and recrystallization. In essence, the substrate microstructure is manipulated using ion beams to induce changes in impurity solubility, crystal symmetry and cation bonding, which exert a profound influence on the microstructure of the embedded precipitates-a concept familiar in metallurgy(8). This approach can be extended to exercise control over virtually any type of precipitate (such as metals, insulators or magnetic clusters) as well as epitaxial thin films.
引用
收藏
页码:384 / 386
页数:3
相关论文
共 21 条
[1]   GROWTH OF ALTERNATING (100)/(111)-ORIENTED II-VI REGIONS FOR QUASI-PHASE-MATCHED NONLINEAR-OPTICAL DEVICES ON GAAS SUBSTRATES [J].
ANGELL, MJ ;
EMERSON, RM ;
HOYT, JL ;
GIBBONS, JF ;
EYRES, LA ;
BORTZ, ML ;
FEJER, MM .
APPLIED PHYSICS LETTERS, 1994, 64 (23) :3107-3109
[2]   STRUCTURAL PHASE-BEHAVIOR IN II-VI SEMICONDUCTOR NANOPARTICLES [J].
BANDARANAYAKE, RJ ;
WEN, GW ;
LIN, JY ;
JIANG, HX ;
SORENSEN, CM .
APPLIED PHYSICS LETTERS, 1995, 67 (06) :831-833
[3]   X-RAY STRUCTURAL CHARACTERIZATION OF LARGER CDSE SEMICONDUCTOR CLUSTERS [J].
BAWENDI, MG ;
KORTAN, AR ;
STEIGERWALD, ML ;
BRUS, LE .
JOURNAL OF CHEMICAL PHYSICS, 1989, 91 (11) :7282-7290
[4]   QUANTUM CRYSTALLITES AND NONLINEAR OPTICS [J].
BRUS, L .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1991, 53 (06) :465-474
[5]   MONOLAYER RECONSTRUCTION ON POLAR SURFACES OF RUBY [J].
BURSILL, LA ;
LIN, PJ .
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1989, 60 (03) :307-320
[6]   MICROSTRUCTURAL CHARACTERISTICS OF LAYERED METASTABLE PHASES [J].
CHOU, TC ;
NIEH, TG .
SCRIPTA METALLURGICA ET MATERIALIA, 1992, 26 (12) :1895-1900
[7]  
COLVIN VL, 1994, NATURE, V370, P354, DOI 10.1038/370354a0
[8]   SINGLE-CRYSTAL FILMS OF SILICON ON INSULATORS [J].
FILBY, JD ;
NIELSEN, S .
BRITISH JOURNAL OF APPLIED PHYSICS, 1967, 18 (10) :1357-&
[9]   THE INFLUENCE OF HELIUM DOPING ON THE DAMAGE MICROSTRUCTURE OF HEAVY-ION IRRADIATED ALPHA-AL2O3 [J].
LEE, WE ;
JENKINS, ML ;
PELLS, GP .
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1985, 51 (05) :639-659
[10]  
Min KS, 1996, APPL PHYS LETT, V68, P2511, DOI 10.1063/1.115838