Chemical force microscopy of -CH3 and -COOH terminal groups in mixed self-assembled monolayers by pulsed-force-mode atomic force microscopy

被引：47

作者：

Okabe, Y ^{[1
]}

Akiba, U ^{[1
]}

Fujihira, M ^{[1
]}

机构：

[1] Tokyo Inst Technol, Dept Biomol Engn, Midori Ku, Yokohama, Kanagawa 2268501, Japan

来源：

APPLIED SURFACE SCIENCE | 2000年 / 157卷 / 04期

关键词：

chemical force microscopy; chemically modified AFM tips; adhesive force mapping; self-assembled monolayers;

D O I：

10.1016/S0169-4332(99)00557-7

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Pulsed-force-mode atomic force microscopy (PFM-AFM), with functionalized probe tips, was applied to discrimination of chemical functionalities of a binary system of mixed self-assembled monolayers (SAMs) consisting of CH3- and COOH-terminating alkane thiols. PFM-AFM enabled simultaneous imaging surface topography and distribution of adhesive forces between the tip and sample surfaces. Since the adhesive forces were directly related to interaction between the chemical functional groups on the tip and sample surfaces, we combined the adhesive force mapping by PFM-AFM with the chemically modified tips to accomplish imaging the sample surface with the chemical sensitivity. The adhesive force mapping by PFM-AFM with the CH3-modified tips in pure water clearly discriminated the hydrophobic CH3-terminating domains embedded in the COOH-terminating SAM matrix. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：398 / 404

页数：7