Investigation of Gold Nanoparticle Inks for Low-Temperature Lead-Free Packaging Technology

被引:53
作者
Bakhishev, Teymur [1 ]
Subramanian, Vivek [1 ]
机构
[1] Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA
基金
美国国家科学基金会;
关键词
Lead-free; electronics packaging; low temperature; nanoparticle solder; electromigration; ELECTROMIGRATION;
D O I
10.1007/s11664-009-0918-9
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Gold nanoparticle inks were investigated as a potential candidate for lead-free packaging applications. Inks consisted of surfactant-passivated nanoparticles dissolved in a solvent. Optimized gold inks are able to sinter at temperatures as low as 120A degrees C and achieve conductivities of up to 70% of bulk. Once sintered, the metallic structure reverts to bulk-like properties and approaches bulk reliability and performance. Thus nanoparticle-based solders would operate at much lower homologous temperatures as compared with alloy-based solders. Nanoparticle inks under investigation were sintered at 180A degrees C. The resulting material exhibited a resistivity of 5 mu Omega cm, which is significantly lower than those of Pb-Sn and Sn-Ag-Cu. Electromigration studies were carried out and time to failure was investigated as a function of temperature. Electromigration activation energy was calculated through Black's equation to be 0.52 eV, which is consistent with surface/grain boundary diffusion. These studies suggest that nanoparticle-ink-based films show excellent robustness, due to their irreversible conversion to bulk-like materials. Nanoparticle inks are thus promising candidates for next-generation lead-free solders.
引用
收藏
页码:2720 / 2725
页数:6
相关论文
共 13 条
[1]   Lead-free solders in microelectronics [J].
Abtew, M ;
Selvaduray, G .
MATERIALS SCIENCE & ENGINEERING R-REPORTS, 2000, 27 (5-6) :95-141
[2]   Electromigration in gold thin films [J].
Aguilar, M ;
Oliva, AI ;
Quintana, P ;
Pena, JL .
THIN SOLID FILMS, 1998, 317 (1-2) :189-192
[3]   ELECTROMIGRATION - A BRIEF SURVEY AND SOME RECENT RESULTS [J].
BLACK, JR .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1969, ED16 (04) :338-&
[4]   SIZE EFFECT ON MELTING TEMPERATURE OF GOLD PARTICLES [J].
BUFFAT, P ;
BOREL, JP .
PHYSICAL REVIEW A, 1976, 13 (06) :2287-2298
[5]   Effect of heat treatment on the electrical resistivity of near-eutectic Sn-Ag-CuPb-free solder alloys [J].
Cook, BA ;
Anderson, IE ;
Harringa, JL ;
Terpstra, RL .
JOURNAL OF ELECTRONIC MATERIALS, 2002, 31 (11) :1190-1194
[6]   MICROSTRUCTURE AND MECHANICAL-PROPERTIES OF PB-FREE SOLDER ALLOYS FOR LOW-COST ELECTRONIC ASSEMBLY - A REVIEW [J].
GLAZER, J .
JOURNAL OF ELECTRONIC MATERIALS, 1994, 23 (08) :693-700
[7]   Alkanethiolate gold cluster molecules with core diameters from 1.5 to 5.2 nm: Core and monolayer properties as a function of core size [J].
Hostetler, MJ ;
Wingate, JE ;
Zhong, CJ ;
Harris, JE ;
Vachet, RW ;
Clark, MR ;
Londono, JD ;
Green, SJ ;
Stokes, JJ ;
Wignall, GD ;
Glish, GL ;
Porter, MD ;
Evans, ND ;
Murray, RW .
LANGMUIR, 1998, 14 (01) :17-30
[8]   Plastic-compatible low resistance printable gold nanoparticle conductors for flexible electronics [J].
Huang, D ;
Liao, F ;
Molesa, S ;
Redinger, D ;
Subramanian, V .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2003, 150 (07) :G412-G417
[9]  
JIANG H, 2007, INT S ADV PACK MAT P, P321
[10]  
Joo S, 2007, ELEC COMP C, P219