A comparative study of semiconductor sensitization by micro-crystals of indium sulfide on various porous wide band gap semiconductor substrates

被引:11
作者
Sirimanne, PM
Yasaki, Y
Sonoyama, N
Sakata, T
机构
[1] Tokyo Inst Technol, Dept Elect Chem, Interdisciplinary Grad Sch Sci & Engn, Midori Ku, Yokohama, Kanagawa 2268502, Japan
[2] Toyota Technol Inst, Semicond Lab, Tempa Ku, Nagoya, Aichi 4688511, Japan
关键词
sulfurization; micro-crystals; indium sulfide; semiconductor sensitization;
D O I
10.1016/S0254-0584(02)00231-6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Semiconductor sensitization on various n-type wide band gap semiconductors was studied by micro-crystals of n-type indium sulfide. The generation of an anodic photocurrent on the electrode is explained from the viewpoint of semiconductor sensitization. A very high incident photon-to-current conversion efficiency (IPCE) of more than 80% was achieved on In2S3/In2O3 electrodes in a polysulfide electrolyte. The observed values for the IPCE for In2S3/TiO2 and In2S3/ZnO electrodes were rather low compared to that of ln(2)S(3)/In2O3 electrodes, in the same electrolyte. The semiconductor sensitization process was not observed on In2S3/ZnS electrodes. Different kinetics at the semiconductor/semiconductor interface are the reasons for the observed difference of the IPCE, for the electrodes. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:234 / 238
页数:5
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