Metal-coated carbon nanotube tip for scanning tunneling microscope

被引：33

作者：

Ikuno, T

Katayama, M

Kishida, M

Kamada, K

Murata, Y

Yasuda, T

Honda, S

Lee, JG

Mori, H

Oura, K

机构：

[1] Osaka Univ, Grad Sch Engn, Dept Elect Engn, Suita, Osaka 5650871, Japan

[2] Osaka Univ, Res Ctr Ultrahigh Voltage Electron Microscopy, Ibaraki 5670047, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 2004年 / 43卷 / 5A期

关键词：

carbon nanotube; metal-carbon nanotube composite; coating; scanning tunneling microscopy/spectroscopy; pulsed laser deposition; Si(111)-7 x 7;

D O I：

10.1143/JJAP.43.L644

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A metal-coated carbon nanotube (CNT) tip for scanning tunneling microscope (STM) has been developed. By pulsed laser deposition (PLD), a CNT attached to a tungsten tip was uniformly coated with 3-6 nm of tungsten thin layer. The observation of a Si(1 1 1)-7 x 7 surface using the tungsten-coated CNT tip demonstrated stable atomic imaging and potentiality of scanning tunneling spectroscopy (STS) measurement, which can be achieved from the pristine stage. It was demonstrated that the mechanical robustness and flexibility of the tip were maintained by virtue of the thin coated layer.

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收藏

页码：L644 / L646

页数：3

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