Deposition and characterization of PEDOT/ZnO layers onto PET substrates

被引：14

作者：

Garganourakis, M. ^{[1
]}

Logothetidis, S. ^{[1
]}

Pitsalidis, C. ^{[1
]}

Georgiou, D. ^{[1
]}

Kassavetis, S. ^{[1
]}

Laskarakis, A. ^{[1
]}

机构：

[1] Aristotle Univ Thessaloniki, Dept Phys, Lab Thin Films Nanosyst & Nanometrol, GR-54124 Thessaloniki, Greece

来源：

THIN SOLID FILMS | 2009年 / 517卷 / 23期

关键词：

ZnO; PEDOT:PSS; Magnetron sputtering; Optical parameters; Spectroscopic ellipsometry; X-ray diffraction; Atomic force microscopy; LIGHT-EMITTING DEVICES; OXIDE THIN-FILMS; OPTICAL-PROPERTIES; ZINC-OXIDE; ZNO; POLYMER;

D O I：

10.1016/j.tsf.2009.02.100

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

ZnO thin films of different thicknesses were deposited by pulsed direct-current magnetron sputtering onto poly(ethylene terephthalate) (PET) substrates and afterwards poly 3, 4-ethylenedioxythiophene:polystyrenesulfonate (PEDOT:PSS) was spin-coated onto the ZnO film. Spectroscopic ellipsometry in the Vis-fUV energy range (1.5-6.5 eV), X-ray diffraction and atomic force microscopy were used to reveal the properties of the deposited films. The size of crystallites increased from 5.1 to 7.4 nm, whereas the crystallinity of the ZnO films has been improved. The influence of different ZnO thickness on the optical properties of the PEDOT:PSS layer was studied as well. As the thickness of ZnO films increased. the surface roughness increased but the energy gap decreased after a critical thickness. Concerning the consequences to the PEDOT: PSS optical properties, no major changes occurred in the transition energies. (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：6409 / 6413

页数：5

共 24 条

[1]

Azzam R.M.A., 1977, Ellipsometry and Polarized Light

[2] Low-temperature deposition of ZnO thin films on PET and glass substrates by DC-sputtering technique [J].