Influences of biaxial strains on the vibrational and exciton energies in ZnO

被引:78
作者
Gruber, T [1 ]
Prinz, GM [1 ]
Kirchner, C [1 ]
Kling, R [1 ]
Reuss, F [1 ]
Limmer, W [1 ]
Waag, A [1 ]
机构
[1] Univ Ulm, Abt Halbleiterphys, D-89069 Ulm, Germany
关键词
D O I
10.1063/1.1755433
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have investigated the structural, optical, and vibrational properties of strained heteroepitaxial ZnO layers by high resolution x-ray diffraction, reflectivity, and Raman measurements. The ZnO layers were grown by metalorganic vapor phase epitaxy on sapphire substrates under varying growth conditions. A Poisson number of mu=0.303 and phonon deformation-potential parameters of a=-690 cm(-1), b=-940 cm(-1) for the high-energy E-2 optical phonon mode have been determined. The shift of the excitonic resonances due to the strain in the layers agrees well with the experimentally determined Poisson ratio using the deformation-potentials D-1-D-4 determined by Wrzesinski and Frohlich [Phys. Rev. B 56, 13087 (1997)]. (C) 2004 American Institute of Physics.
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页码:289 / 293
页数:5
相关论文
共 27 条
[1]   Optically pumped lasing of ZnO at room temperature [J].
Bagnall, DM ;
Chen, YF ;
Zhu, Z ;
Yao, T ;
Koyama, S ;
Shen, MY ;
Goto, T .
APPLIED PHYSICS LETTERS, 1997, 70 (17) :2230-2232
[2]   PIEZOSPECTROSCOPIC STUDY OF RAMAN-SPECTRUM OF CADMIUM-SULFIDE [J].
BRIGGS, RJ ;
RAMDAS, AK .
PHYSICAL REVIEW B, 1976, 13 (12) :5518-5529
[3]   Effects of biaxial strain on exciton resonance energies of hexagonal GaN heteroepitaxial layers [J].
Chichibu, S ;
Shikanai, A ;
Azuhata, T ;
Sota, T ;
Kuramata, A ;
Horino, K ;
Nakamura, S .
APPLIED PHYSICS LETTERS, 1996, 68 (26) :3766-3768
[4]   Raman and photoluminescence studies of biaxial strain in GaN epitaxial layers grown on 6H-SiC [J].
Davydov, VY ;
Averkiev, NS ;
Goncharuk, IN ;
Nelson, DK ;
Nikitina, IP ;
Polkovnikov, AS ;
Smirnov, AN ;
Jacobsen, MA ;
Semchinova, OK .
JOURNAL OF APPLIED PHYSICS, 1997, 82 (10) :5097-5102
[5]   High-pressure Raman spectroscopy study of wurtzite ZnO [J].
Decremps, F ;
Pellicer-Porres, J ;
Saitta, AM ;
Chervin, JC ;
Polian, A .
PHYSICAL REVIEW B, 2002, 65 (09) :921011-921014
[6]   Strain-fields effects and reversal of the nature of the fundamental valence band of ZnO epilayers [J].
Gil, B ;
Lusson, A ;
Sallet, V ;
Said-Hassani, SA ;
Triboulet, R ;
Bigenwald, P .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2001, 40 (10B) :L1089-L1092
[7]   Valence-band physics and the optical properties of GaN epilayers grown onto sapphire with wurtzite symmetry [J].
Gil, B ;
Briot, O ;
Aulombard, RL .
PHYSICAL REVIEW B, 1995, 52 (24) :17028-17031
[8]  
Gruber T, 2002, PHYS STATUS SOLIDI A, V192, P166, DOI 10.1002/1521-396X(200207)192:1<166::AID-PSSA166>3.0.CO
[9]  
2-G
[10]   THERMAL EXPANSION OF SILICON AND ZINE OXIDE (2) [J].
IBACH, H .
PHYSICA STATUS SOLIDI, 1969, 33 (01) :257-&