Structure and mechanical properties of carbon-nickel and CNx-nickel nanocomposite films

被引:35
作者
Kovács, GJ
Sáfrán, G
Geszti, O
Ujvári, T
Bertóti, I
Radnóczi, G
机构
[1] Res Inst Tech Phys & Mat Sci, H-1525 Budapest, Hungary
[2] Chem Res Ctr, Res Lab Mat & Environm Chem, H-1525 Budapest, Hungary
基金
美国国家科学基金会;
关键词
CNx; nanocomposites; thin films; magnetron-sputtering; high resolution transmission electron microscopy; hardness;
D O I
10.1016/j.surfcoat.2003.10.081
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
DC sputtered carbon-nickel and carbon-nitride-nickel thin films were investigated by high resolution electron microscopy, Xray microanalysis and nanoindentation to clarify the influence of Ni addition on the structure, formation and mechanical properties. The films were deposited in argon or nitrogen plasma at temperatures from 25 to 800 degreesC onto NaCl and SiO2 substrates. The microstructures can be described as nanocomposites, built from Ni/Ni3C nanocrystals in a carbon/CNx matrix. The mechanical properties of the films were found to be strongly dependent on the growth temperature along with the changes of the structure. The highest hardness of 14 GPa was measured for the film grown at 200 degreesC, while low values (down to 2-6 GPa) were obtained for films deposited at high temperatures. The decrease of the hardness is thought to be primarily the consequence of morphological changes of the crystalline phase. In films grown at room temperature and at 200 degreesC, an amorphous or nearly amorphous matrix was observed, while at higher temperatures up to 800 degreesC, the matrix showed relatively high ordering in the form of curved graphite/CNx layer stacks. At all temperatures above 200 degreesC, the Ni/Ni3C particles were encapsulated in three- five-layer thick graphitic shells following exactly the surface of the Ni particles. TEM measurements confirm that nickel enhances the formation of ordered C/CNx structures as graphitic shells and fullerene-like domains in sputter-deposited films. Nanoindentation experiments show that the CNx-Ni films have slightly higher hardness compared to the C-Ni films. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:331 / 334
页数:4
相关论文
共 17 条
[1]   Nanoindentation and FEM study of the effect of internal stress on micro/nano mechanical property of thin CNx films [J].
Bai, MW ;
Kato, K ;
Umehara, N ;
Miyake, Y .
THIN SOLID FILMS, 2000, 377 :138-147
[2]   Mechanical and tribological properties of CNx films deposited by reactive magnetron sputtering [J].
Broitman, E ;
Hellgren, N ;
Wänstrand, O ;
Johansson, MP ;
Berlind, T ;
Sjöström, H ;
Sundgren, JE ;
Larsson, M ;
Hultman, L .
WEAR, 2001, 248 (1-2) :55-64
[3]   GROWTH AND CHARACTERIZATION OF C-N THIN-FILMS [J].
CHEN, MY ;
LIN, X ;
DRAVID, VP ;
CHUNG, YW ;
WONG, MS ;
SPROUL, WD .
SURFACE & COATINGS TECHNOLOGY, 1992, 55 (1-3) :360-364
[4]   Role of nitrogen in the formation of hard and elastic CNx thin films by reactive magnetron sputtering [J].
Hellgren, N ;
Johansson, MP ;
Broitman, E ;
Hultman, L ;
Sundgren, JE .
PHYSICAL REVIEW B, 1999, 59 (07) :5162-5169
[5]  
HULTMAN L, 2003, MRS BULL, P194
[6]   Comparison of tribological properties of carbon and carbon nitride protective coatings over magnetic media [J].
Khurshudov, A ;
Kato, K ;
Daisuke, S .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1996, 14 (05) :2935-2939
[7]   Growth and characterisation of hard and elastic carbon nitride thin films [J].
Kolitsch, A ;
Möller, W ;
Malkow, T ;
Bull, SJ ;
Magula, V ;
Domankova, M .
SURFACE & COATINGS TECHNOLOGY, 2000, 128 :126-132
[8]   ELEMENTAL COMPOSITION AND MICROSTRUCTURE OF REACTIVELY SPUTTERED CARBON NITRIDE THIN-FILMS [J].
KUMAR, S ;
TANSLEY, TL .
JOURNAL OF APPLIED PHYSICS, 1994, 76 (07) :4390-4392
[9]   Analysis of nano-indentation measurements on carbon nitride films [J].
Kusano, Y ;
Hutchings, IM .
SURFACE & COATINGS TECHNOLOGY, 2003, 169 :739-742
[10]   IONIZED MAGNETRON SPUTTER-DEPOSITION OF AMORPHOUS-CARBON NITRIDE THIN-FILMS [J].
LI, D ;
LOPEZ, S ;
CHUNG, YW ;
WONG, MS ;
SPROUL, WD .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1995, 13 (03) :1063-1066