Dislocations, crystallite size, and planar faults in nanocrystalline ceria

被引：8

作者：

Aghdaee, S. R. ^{[1
]}

Soleimanian, V. ^{[1
]}

机构：

[1] Iran Univ Sci & Technol, Dept Phys, Tehran 16844, Iran

来源：

POWDER DIFFRACTION | 2009年 / 24卷 / 03期

关键词：

anisotropic line broadening; crystallite size; dislocation density; PLASTICALLY DEFORMED-CRYSTALS; LINE-BROADENING ANALYSIS; X-RAY; PROFILE ANALYSIS; DIFFRACTION; ANISOTROPY; VARIANCE; CONTRAST;

D O I：

10.1154/1.3187210

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The modified Williamson-Hall and Warren-Averbach methods were used successfully for analyzing experimentally observed anisotropic X-ray diffraction line broadening and for determining reliable values of crystallite size and dislocation density in cerium oxide. The modified Williamson-Hall plot gives 22.3(2) nm for volume-weighted crystallite size, while the modified Warren-Averbach produces 18.0(2) nm for area-weighted grain size. The dislocation density and effective outer cut-off radius of dislocations obtained from the modified Warren-Averbach method are 1.8(3) x 10(15) m(-2) and 15.5(1) nm, respectively. (C) 2009 International Centre for Diffraction Data. [DOI: 10.1154/1.3187210]

引用

页码：228 / 233

页数：6

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