Characteristics and high water-repellency of a-C:H films deposited by r.f. PECVD

被引:16
作者
Kim, JD
Lee, KH
Kim, KY
Sugimura, H
Takai, O
Wu, YY
Inoue, Y
机构
[1] Nagoya Univ, Grad Sch Engn, Nagoya, Aichi 4648603, Japan
[2] Aichi Sci & Technol Fdn, Nagoya, Aichi 4600002, Japan
[3] Nagoya Univ, Res Ctr Nucl Mat Recycle, Nagoya, Aichi, Japan
关键词
a-C : H film; PECVD; water-repellency; surface groups; surface roughness;
D O I
10.1016/S0257-8972(02)00704-1
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Hydrogenated amorphous carbon (a-C:H) films have been prepared by r.f. plasma-enhanced chemical vapor deposition at low bias voltage from 0 to -40 V with CH4 and H-2 as raw materials. The a-C:H films deposited with no bias applied showed characteristics of polymeric films with a large fluorescence level while the a-C:H films deposited at a bias voltage of r.f. 150 W showed characteristics from diamond-like carbon to graphitic nature with a significantly reduced fluorescence level. High water-repellency of over 140degrees in a contact angle obtained at a-C:H/trimetylmethoxysilane/Si structures. This high water-repellency is due to CH groups on surfaces and the roughness. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:135 / 139
页数:5
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