X-ray Raman spectroscopy of carbon in asphaltene: Light element characterization with bulk sensitivity

被引：64

作者：

Bergmann, U

Mullins, OC

Cramer, SP ^{[1
]}

机构：

[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Phys Biosci Div, Berkeley, CA 94720 USA

[2] Univ Calif Davis, Dept Appl Sci, Davis, CA 95616 USA

[3] Schlumberger Doll Res Ctr, Ridgefield, CT 06877 USA

来源：

ANALYTICAL CHEMISTRY | 2000年 / 72卷 / 11期

关键词：

D O I：

10.1021/ac990730t

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

X-ray Raman spectra of the carbon K-edge have been recorded using 6.461 keV radiation for a petroleum asphaltene, By comparison with coronene, graphite, and paraffin standards, the asphaltene spectrum is seen to be composed of contributions from saturated and aromatic carbon species. The information contained in the carbon K-edge was extracted with bulk (similar to 1 mm) sensitivity, because the Raman method used hard X-rays, This helps alleviate concerns about surface artifacts that frequently occur with soft X-ray spectroscopy of light elements. X-ray Raman spectroscopy shows great potential for characterization of light elements in fuels, catalysts, and other complex materials under chemically relevant conditions.

引用

页码：2609 / 2612

页数：4

共 43 条

[1] PROBING DEPTH OF SOFT-X-RAY ABSORPTION-SPECTROSCOPY MEASURED IN TOTAL-ELECTRON-YIELD MODE [J].