Direct observation of the molten state of nanometer-sized particles with an atomic force microscope: A feasibility study

被引:5
作者
Ismail, S [1 ]
Deppert, K [1 ]
Junno, T [1 ]
Kortegaard, C [1 ]
Larne, H [1 ]
Magnusson, MH [1 ]
Thelander, C [1 ]
Samuelson, L [1 ]
机构
[1] Lund Univ, S-22100 Lund, Sweden
关键词
atomic force microscope; melting point; nanoparticles;
D O I
10.1023/A:1021109630111
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
An atomic force microscope (AFM) was used to directly examine the physical state of nanometer-sized particles. The critical diameter of indium particles, where evidence of melting at room temperature was observed, was 7.8 +/- 1.2 nm. This conclusion is based on a method relying on the manipulation of particles in ambient air and at constant temperature. This method involves a simple set-up that permits a combination of both manipulation and imaging of individual particles. To determine whether a particle is molten, three criteria are used: the merging of particles to form bigger spherical particles, a tip-induced shape change, and the formation of nanofibers. All three criteria have been checked using other particle materials. An attempt at 56degreesC revealed oxidation of the indium particles as the major problem for melting investigation. Manipulations under high-purity nitrogen atmosphere support the validity of the findings. The use of the AFM to determine whether a nanoparticle is molten is, however, complicated by the oxidation issue.
引用
收藏
页码:351 / 356
页数:6
相关论文
共 12 条
[1]   SIZE DEPENDENCE OF MELTING-POINT OF SMALL PARTICLES OF INDIUM [J].
BERMAN, RP ;
CURZON, AE .
CANADIAN JOURNAL OF PHYSICS, 1974, 52 (11) :923-929
[2]   SIZE EFFECT ON MELTING TEMPERATURE OF GOLD PARTICLES [J].
BUFFAT, P ;
BOREL, JP .
PHYSICAL REVIEW A, 1976, 13 (06) :2287-2298
[3]  
*CRC, 1997, HDB CHEM PHYS
[4]   SINTERED AEROSOL MASKS FOR DRY-ETCHED QUANTUM DOTS [J].
DEPPERT, K ;
MAXIMOV, I ;
SAMUELSON, L ;
HANSSON, HC ;
WEIDENSOHLER, A .
APPLIED PHYSICS LETTERS, 1994, 64 (24) :3293-3295
[5]   CONTROLLED MANIPULATION OF NANOPARTICLES WITH AN ATOMIC-FORCE MICROSCOPE [J].
JUNNO, T ;
DEPPERT, K ;
MONTELIUS, L ;
SAMUELSON, L .
APPLIED PHYSICS LETTERS, 1995, 66 (26) :3627-3629
[6]   CONTACT MODE ATOMIC-FORCE MICROSCOPY IMAGING OF NANOMETER-SIZED PARTICLES [J].
JUNNO, T ;
ANAND, S ;
DEPPERT, K ;
MONTELIUS, L ;
SAMUELSON, L .
APPLIED PHYSICS LETTERS, 1995, 66 (24) :3295-3297
[7]   Single-electron devices via controlled assembly of designed nanoparticles [J].
Junno, T ;
Magnusson, MH ;
Carlsson, SB ;
Deppert, K ;
Malm, JO ;
Montelius, L ;
Samuelson, L .
MICROELECTRONIC ENGINEERING, 1999, 47 (1-4) :179-183
[8]  
Knutson E. O., 1975, Journal of Aerosol Science, V6, P443, DOI 10.1016/0021-8502(75)90060-9
[9]   SURFACE-TENSION AND DENSITY-MEASUREMENTS FOR INDIUM AND URANIUM USING A SESSILE-DROP APPARATUS WITH GLOW-DISCHARGE CLEANING [J].
MCCLELLAND, MA ;
SZE, JS .
SURFACE SCIENCE, 1995, 330 (03) :313-322
[10]   DIRECT OBSERVATION OF THE TIP SHAPE IN SCANNING PROBE MICROSCOPY [J].
MONTELIUS, L ;
TEGENFELDT, JO .
APPLIED PHYSICS LETTERS, 1993, 62 (21) :2628-2630