Performance improvement of the memory hierarchy of RISC-systems by application of 3-D technology

被引:21
作者
Kleiner, MB [1 ]
Kuhn, SA [1 ]
Ramm, P [1 ]
Weber, W [1 ]
机构
[1] FRAUNHOFER INST SOLID STATE TECHNOL,MUNICH,GERMANY
来源
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART B-ADVANCED PACKAGING | 1996年 / 19卷 / 04期
关键词
RISC; memory hierarchy; cache; 3-D IC; 3-D technology; 3-D packaging; vertically integrated circuits; performance; modeling;
D O I
10.1109/96.544361
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper, the performance of the memory hierarchy of RISC-systems for implementations employing three-dimensional (3-D) technology is investigated, Relating to RISC-systems, 3-D technology enables the integration of multiple chip-layers of memory together with the processor in one 3-D IC, In a first step, the second-level cache can be realized in one 3-D IC with professor and first-level cache, This results in a considerable reduction of the hit time of the second-level cache due to a decreased access time and a larger allowable bus-width to the second-level cache, In a further step, the main memory can be integrated which relieves restrictions with respect to the bus-width to main memory, The use of 3-D technology for system implementation is observed to have a significant impact on the optimum design and performance of the memory hierarchy, Based on an analytical model, performance improvements on the order of 20% to 25% in terms of the average time per instruction are evaluated for implementations employing 3-D technology over conventional ones. It is concluded that 3-D technology is very attractive for future RISC-system generations.
引用
收藏
页码:709 / 718
页数:10
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