A 3.3-V 12-NS 16-MB CMOS SRAM

被引:12
作者
GOTO, H [1 ]
OHKUBO, H [1 ]
KONDOU, K [1 ]
OHKAWA, M [1 ]
MITANI, H [1 ]
HORIBA, S [1 ]
SOEDA, M [1 ]
HAYASHI, F [1 ]
HACHIYA, Y [1 ]
SHIMIZU, T [1 ]
ANDO, M [1 ]
MATSUDA, Z [1 ]
机构
[1] NEC CORP LTD,ULSI DEVICE DEV LABS,SAGAMIHARA,KANAGAWA 229,JAPAN
关键词
D O I
10.1109/4.165327
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A 16-Mb CMOS SRAM having an access time of 12 ns under a 3.3-V supply has been developed with 0.4-mum process technology. An address access time of 12 ns has been achieved by an optimized architecture, the use of an automated transistor size optimizer, and a read-bus midlevel preset scheme (RBMIPS). For better yield and efficient testing, an on-chip test circuit with three test modes has been implemented.
引用
收藏
页码:1490 / 1496
页数:7
相关论文
共 10 条
[1]   A 15-NS 4-MB CMOS SRAM [J].
AIZAKI, S ;
SHIMIZU, T ;
OHKAWA, M ;
ABE, K ;
AIZAKI, A ;
ANDO, M ;
KUDOH, O ;
SASAKI, I .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1990, 25 (05) :1063-1067
[2]   A 20-NS 4-MB CMOS SRAM WITH HIERARCHICAL WORD DECODING ARCHITECTURE [J].
HIROSE, T ;
KURIYAMA, H ;
MURAKAMI, S ;
YUZURIHA, K ;
MUKAI, T ;
TSUTSUMI, K ;
NISHIMURA, Y ;
KOHNO, Y ;
ANAMI, K .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1990, 25 (05) :1068-1074
[3]  
KATO H, 1992, FEB ISSCC DIG TECH P, P210
[4]   A 25-NS 4-MBIT CMOS SRAM WITH DYNAMIC BIT-LINE LOADS [J].
MIYAJI, F ;
MATSUYAMA, Y ;
KANAISHI, Y ;
SENOH, K ;
EMORI, T ;
HAGIWARA, Y .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1989, 24 (05) :1213-1218
[5]   A 21-MW 4-MB CMOS SRAM FOR BATTERY OPERATION [J].
MURAKAMI, S ;
FUJITA, K ;
UKITA, M ;
TSUTSUMI, K ;
INOUE, Y ;
SAKAMOTO, O ;
ASHIDA, M ;
NISHIMURA, Y ;
KOHNO, Y ;
NISHIMURA, T ;
ANAMI, K .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1991, 26 (11) :1563-1570
[6]  
NAKAMURA K, 1992, FEB ISSCC DIG TECH P, P212
[7]  
Ohkubo H., 1991, International Electron Devices Meeting 1991. Technical Digest (Cat. No.91CH3075-9), P481, DOI 10.1109/IEDM.1991.235351
[8]   A 4-MB CMOS SRAM WITH A PMOS THIN-FILM-TRANSISTOR LOAD CELL [J].
OOTANI, T ;
HAYAKAWA, S ;
KAKUMU, M ;
AONO, A ;
KINUGAWA, M ;
TAKEUCHI, H ;
NOGUCHI, K ;
YABE, T ;
SATO, K ;
MAEGUCHI, K ;
OCHII, K .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1990, 25 (05) :1082-1092
[9]   A 23-NS 4-MB CMOS SRAM WITH 0.2-MU A STANDBY CURRENT [J].
SASAKI, K ;
ISHIBASHI, K ;
SHIMOHIGASHI, K ;
YAMANAKA, T ;
MORIWAKI, N ;
HONJO, S ;
IKEDA, S ;
KOIKE, A ;
MEGURO, S ;
MINATO, O .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1990, 25 (05) :1075-1081
[10]  
SINOHARA H, 1985, FEB ISSCC DIG TECH P, P62