Improvement of imprinted pattern uniformity using sapphire mold

被引:14
作者
Komuro, M
Tokano, Y
Taniguchi, J
Kawasaki, T
Miyamoto, I
Hiroshima, H
机构
[1] AIST Tsukuba Cent 2, Natl Inst Adv Ind Sci & Technol, Adv Semicond Res Ctr, Tsukuba, Ibaraki 3058568, Japan
[2] Sci Univ Tokyo, Dept Appl Elect, Noda, Chiba 2788510, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2002年 / 41卷 / 6B期
关键词
nanoimprint; lithography; photocurable polymer; sapphire; pattern replication;
D O I
10.1143/JJAP.41.4182
中图分类号
O59 [应用物理学];
学科分类号
摘要
In order to improve the adhesion property between a mold and photocurable polymer film in photosolidified imprint lithography, a sapphire plate was used which has advantages such as large Young's modulus, large Knoop hardness value, and large ultimate compressive and tensile forces compared with a quartz plate. The contact angle of water on the sapphire surface is considerably larger than that on the quartz surface and comparable with that on the quartz surface with hydrophobic treatment. As the number of imprinting experiments increases, the contact angle for the sapphire remains, constant although that for the surface-treated quartz gradually decreases. From the 40 imprinting experiments using the same sapphire mold, no degradation of the replicated pattern in the photocurable polymer is observed. On the other hand, thin polymer residues are observed to remain at the edge of the protruding mold patterns, probably due to the rough side wall structures which made them easy to adhere to the polymer. It is considered that such a residual polymer film on the mold is too thin to be replicated in the imprinting experiment.
引用
收藏
页码:4182 / 4185
页数:4
相关论文
共 7 条
[1]   Step and flash imprint lithography: Template surface treatment and defect analysis [J].
Bailey, T ;
Choi, BJ ;
Colburn, M ;
Meissl, M ;
Shaya, S ;
Ekerdt, JG ;
Sreenivasan, SV ;
Willson, CG .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2000, 18 (06) :3572-3577
[2]   Sub-10 nm imprint lithography and applications [J].
Chou, SY ;
Krauss, PR ;
Zhang, W ;
Guo, LJ ;
Zhuang, L .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1997, 15 (06) :2897-2904
[3]   IMPRINT OF SUB-25 NM VIAS AND TRENCHES IN POLYMERS [J].
CHOU, SY ;
KRAUSS, PR ;
RENSTROM, PJ .
APPLIED PHYSICS LETTERS, 1995, 67 (21) :3114-3116
[4]   Mold-assisted nanolithography: A process for reliable pattern replication [J].
Haisma, J ;
Verheijen, M ;
vandenHeuvel, K ;
vandenBerg, J .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (06) :4124-4128
[5]  
Jeon NL, 1998, ADV MATER, V10, P1466, DOI 10.1002/(SICI)1521-4095(199812)10:17<1466::AID-ADMA1466>3.0.CO
[6]  
2-5
[7]   Imprint characteristics by photo-induced solidification of liquid polymer [J].
Komuro, M ;
Taniguchi, J ;
Inoue, S ;
Kimura, N ;
Tokano, Y ;
Hiroshima, H ;
Matsui, S .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2000, 39 (12B) :7075-7079