Scanning force microscopy in a liquid on single latent ion tracks:: Towards applications in polymers and atomic resolution on crystals

被引:7
作者
Ohnesorge, FM [1 ]
Müller, A [1 ]
Neumann, R [1 ]
机构
[1] Gesell Schwerionenforsch mbH, D-64291 Darmstadt, Germany
关键词
atomic force microscopy in fluid; latent ion tracks; polymers; calcite;
D O I
10.1016/S0168-583X(99)01153-2
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Latent ion tracks are characterised by scanning force microscopy (SFM) in fluids, where the imaging forces can be minimized to extremely small values of order 10 (10) N and even below. Most importantly, on the surface of polymer foils such as PI and PET, individual ring-shaped (diameter 15-20 nm, apparent height 5-10 nm) latent ion tracks could be revealed. Elasticity artifacts in SFM on a soft sample like a polymer are briefly discussed, clarifying that the true height of these ion tracks may be as small as 2 nm, which explains why they have not been observed yet by SEM. Atomic resolution imaging in water on ionic crystals (calcite) is presented in order to discuss the difficulties when aiming for true atomic resolution on single ion tracks. For instance, ion tracks on calcite can be well detected in air on the nm-scale, but when trying to realize true atomic resolution in water - possible on unirradiated calcite - the tracks begin to etch rapidly. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:938 / 943
页数:6
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