Current self-distribution effect in diode lasers: Analytic criterion and numerical study

We consider a current self-distribution (current crowding) effect that can be induced by stimulated recombination in diode lasers. In particular, we identify conditions when the injection current density can be sensitive to inhomogeneities of carrier recombination rate. In response to a locally enhanced carrier consumption, the current injection becomes itself inhomogeneous. An analytic criterion is proposed to predict when this effect can lead to suppression of spatial hole-burning, providing improved laser mode stability and spatial stability of the laser beam. Adequacy of the proposed analytic approach is verified by numerical modeling.