Novel SiGe island coarsening kinetics: Ostwald ripening and elastic interactions

被引:115
作者
Floro, JA
Sinclair, MB
Chason, E
Freund, LB
Twesten, RD
Hwang, RQ
Lucadamo, GA
机构
[1] Sandia Natl Labs, Albuquerque, NM 87185 USA
[2] Brown Univ, Div Engn, Providence, RI 02912 USA
[3] Univ Illinois, Ctr Microanal Mat, Urbana, IL 61801 USA
[4] Sandia Natl Labs, Livermore, CA 94551 USA
[5] Lehigh Univ, Dept Mat Sci & Engn, Bethlehem, PA 18015 USA
关键词
D O I
10.1103/PhysRevLett.84.701
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Real-time light scattering measurements of coherent island coarsening during SiGe/Si heteroepitaxy reveal unusual kinetics. In particular, the mean island volume increases superlinearly with time, while the areal density of islands decreases at a faster-than-linear rate. Neither observation is consistent with standard considerations of Ostwald ripening. Modification of the standard theory to incorporate the effect of elastic interactions in the growing island array reproduces the observed behavior.
引用
收藏
页码:701 / 704
页数:4
相关论文
共 22 条
[1]   Formation and equilibration of submonolayer island distributions in Ag/Ag(100) homoepitaxy [J].
Bardotti, L ;
Bartelt, MC ;
Jenks, CJ ;
Stoldt, CR ;
Wen, JM ;
Zhang, CM ;
Thiel, PA ;
Evans, JW .
LANGMUIR, 1998, 14 (06) :1487-1492
[2]   SCALING IN THE GROWTH OF AGGREGATES ON A SURFACE [J].
BEYSENS, D ;
KNOBLER, CM ;
SCHAFFAR, H .
PHYSICAL REVIEW B, 1990, 41 (14) :9814-9818
[3]  
CHAKRAVE.BK, 1967, J PHYS CHEM SOLIDS, V28, P2401, DOI 10.1016/0022-3697(67)90026-1
[4]   Strain-driven alloying in Ge/Si(100) coherent islands [J].
Chaparro, SA ;
Drucker, J ;
Zhang, Y ;
Chandrasekhar, D ;
McCartney, MR ;
Smith, DJ .
PHYSICAL REVIEW LETTERS, 1999, 83 (06) :1199-1202
[5]   Spectroscopic light scattering for real-time measurements of thin film and surface evolution [J].
Chason, E ;
Sinclair, MB ;
Floro, JA ;
Hunter, JA ;
Hwang, RQ .
APPLIED PHYSICS LETTERS, 1998, 72 (25) :3276-3278
[6]   DISLOCATION-FREE STRANSKI-KRASTANOW GROWTH OF GE ON SI(100) [J].
EAGLESHAM, DJ ;
CERULLO, M .
PHYSICAL REVIEW LETTERS, 1990, 64 (16) :1943-1946
[7]   SCALING OF THE DROPLET-SIZE DISTRIBUTION IN VAPOR-DEPOSITED THIN-FILMS [J].
FAMILY, F ;
MEAKIN, P .
PHYSICAL REVIEW LETTERS, 1988, 61 (04) :428-431
[8]   SiGe coherent islanding and stress relaxation in the high mobility regime [J].
Floro, JA ;
Chason, E ;
Twesten, RD ;
Hwang, RQ ;
Freund, LB .
PHYSICAL REVIEW LETTERS, 1997, 79 (20) :3946-3949
[9]   Evolution of coherent islands in Si1-xGex/Si(001) [J].
Floro, JA ;
Chason, E ;
Freund, LB ;
Twesten, RD ;
Hwang, RQ ;
Lucadamo, GA .
PHYSICAL REVIEW B, 1999, 59 (03) :1990-1998
[10]   NUMERICAL-ANALYSIS OF INTERFACE ENERGY-DRIVEN COARSENING IN THIN-FILMS AND ITS CONNECTION TO GRAIN-GROWTH [J].
FLORO, JA ;
THOMPSON, CV .
ACTA METALLURGICA ET MATERIALIA, 1993, 41 (04) :1137-1147