Low energy muons as probes of thin films and surfaces

被引:14
作者
Morenzoni, E
机构
[1] Paul Scherrer Institut, Villigen
[2] Paul Scherrer Institut
关键词
D O I
10.1007/BF03161982
中图分类号
O64 [物理化学(理论化学)、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号
070203 ; 070304 ; 081704 ; 1406 ;
摘要
Polarized muons with kinetic energies of a few eV (epithermal mu(+)) can be generated by slowing down energetic muons in appropriate moderators consisting of a thin layer of a van der Waals gas frozen on a substrate. The availability of polarized muons with kinetic energies in the eV to several keV range opens the possibility to extend the mu SR technique to the study of thin films and surfaces (low energy mu SR, LE-mu SR). We summarize the characteristics of the very slow polarized muons and of a low energy beam based on the moderation technique. We discuss the implantation of muons in thin film samples and the potential and limitations of LE-mu SR. As an example first results obtained by implanting slow mu(+) in a sample consisting of a Ni film deposited on Ag are presented.
引用
收藏
页码:219 / 229
页数:11
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