Mechanisms for the intermetallic formation during the Sn-20In-2.8Ag/Ni soldering reactions

The morphology and growth kinetics of intermetallic compounds formed during the interfacial reactions between liquid Sn-20In-2.8Ag solder and Ni substrates are investigated. Energy-dispersive x-ray (EDX) analysis identifies the composition of the interfacial intermetallics as Ni-3(In0.99In0.01)(4). The soldering reactions at lower temperatures (225-275degreesC) result in the predominant formation of a homogeneous intermetallic layer whose growth is diffusion controlled. At higher soldering temperatures (300-350degreesC), the interfacial intermetallics appear to be long needlelike crystals, and the grooves in between the intermetallics provide fast-diffusion paths for Ni atoms to react with Sn atoms at the intermetallic front, which leads to interface-controlled growth kinetics. The intermetallic needles turned out to be flat slablike after selective etching of the unreacted solder. Kinetics analysis showed that they not only lengthened in the longitudinal direction, but also coarsened transversely by the Ostwald ripening mechanism.