An X-ray reflectivity study of evaporation-induced self-assembled titania-based films

X-Ray reflectivity was used to monitor the structural development of a titania-based film at the solid/air interface by evaporation-induced self-assembly (EISA). A nonionic poly(ethylene oxide)based surfactant, Brij 58, was used as the template and titanium chloride as the inorganic precursor. The reflectivity pattern, film thickness and refractive index were shown to be dependent on film deposition method, whether by casting or by dip-coating onto a silicon wafer, the Brij 58:TiO2 ratio and the relative humidity. At Brij 58 contents of 40 wt%, the reflectivity profile displayed only a single diffraction peak. At 70 wt% Bragg diffraction indicated a lamellar ordering of film components. Modelled reflectivity data suggested a 1060 angstrom thick film that comprised 17 layers of alternating surfactant and titania with a d spacing of about 60 angstrom. The effect of relative humidity on film structure was explored.